About: Examination of dentin surface using AFM and SEM

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Atomic force microscopy (AFM) as one of the techniques of Scanning Probe Microscopy is useful for imaging of surface structures. This method can yield 3D high-resolution topographic images of sample surfaces by using a scanning technique for conductors and insulators on atomic scale. A special construction of AFM scanner enables to observe biological samples in liquid environments. Artefacts caused by dehydration of samples are removed this way. Dentin of human teeth is a vital hydrated tissue. It is strongly sensitive to dehydration and drying that are commonly used in preparation of samples in examinations by Scanning Electron Microscopy (SEM). We describe our experience in examination of dentin surfaces of extracted human third molars using contact method of AFM under moist conditions. Atomic force microscopy (AFM) as one of the techniques of Scanning Probe Microscopy is useful for imaging of surface structures. This method can yield 3D high-resolution topographic images of sample surfaces by using a scanning technique for conductors and insulators on atomic scale. A special construction of AFM scanner enables to observe biological samples in liquid environments. Artefacts caused by dehydration of samples are removed this way. Dentin of human teeth is a vital hydrated tissue. It is strongly sensitive to dehydration and drying that are commonly used in preparation of samples in examinations by Scanning Electron Microscopy (SEM). We describe our experience in examination of dentin surfaces of extracted human third molars using contact method of AFM under moist conditions. (en)
Title	Examination of dentin surface using AFM and SEM Examination of dentin surface using AFM and SEM (en)
skos:prefLabel	Examination of dentin surface using AFM and SEM Examination of dentin surface using AFM and SEM (en)
skos:notation	RIV/61989592:15310/07:00004829!RIV10-MSM-15310___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(1M0512), Z(MSM6198959216)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Vůjtek, Milan Novotný, Radko Kolářová, Hana Chmelíčková, Hana Kubínek, Roman Zapletalová, Zdeňka
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Univerzita Palackého v Olomouci / Přírodovědecká fakulta
http://linked.open...dnocenehoVysledku	420997
http://linked.open...ai/riv/idVysledku	RIV/61989592:15310/07:00004829
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Atomic Force Microscopy (AFM); Scanning Electron Microscopy (SEM); dentin; smear layer (en)
http://linked.open.../riv/klicoveSlovo	Scanning Electron Microscopy (SEM) smear layer dentin Atomic Force Microscopy (AFM)
http://linked.open...ontrolniKodProRIV	[8B696C0B919F]
http://linked.open...i/riv/mistoVydani	Badajoz, Spain
http://linked.open...i/riv/nazevZdroje	Modern Research and Educational Topics in Microscopy
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	6 (xsd:int)
http://linked.open...cetTvurcuVysledku	6 (xsd:int)
http://linked.open...vavai/riv/projekt	Research center of powdered nanomaterials
http://linked.open...UplatneniVysledku	2007
http://linked.open...iv/tvurceVysledku	Novotný, Radko Vůjtek, Milan Kolářová, Hana Chmelíčková, Hana Kubínek, Roman Zapletalová, Zdeňka
http://linked.open...n/vavai/riv/zamer	Modulation of signalling and regulatory pathways in normal and cancer cells
number of pages	1031 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Formatex
https://schema.org/isbn	978-84-611-9420-9
http://localhost/t...ganizacniJednotka	15310
is http://linked.open...avai/riv/vysledek of	Examination of dentin surface using AFM and SEM Examination of dentin surface using AFM and SEM Examination of dentin surface using AFM and SEM

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