About: White-light interferometric method to measure thickness of thin films

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	White-light interferometric method to measure thickness of thin films White-light interferometric method to measure thickness of thin films (en) Metoda interferometrie v bílém světle pro měření tloušťky tenkých vrstev (cs)
Title	White-light interferometric method to measure thickness of thin films White-light interferometric method to measure thickness of thin films (en) Metoda interferometrie v bílém světle pro měření tloušťky tenkých vrstev (cs)
skos:prefLabel	White-light interferometric method to measure thickness of thin films White-light interferometric method to measure thickness of thin films (en) Metoda interferometrie v bílém světle pro měření tloušťky tenkých vrstev (cs)
skos:notation	RIV/61989100:27350/07:00016587!RIV08-GA0-27350___
http://linked.open.../vavai/riv/strany	1-7
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA202/06/0531), Z(MSM6198910016)
http://linked.open...iv/cisloPeriodika	1
http://linked.open...vai/riv/dodaniDat	2008
http://linked.open...aciTvurceVysledku	Hlubina, Petr Ciprian, Dalibor Lesňák, Michal Luňáček, Jiří
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoká škola báňská - Technická univerzita Ostrava / Hornicko-geologická fakulta
http://linked.open...dnocenehoVysledku	461263
http://linked.open...ai/riv/idVysledku	RIV/61989100:27350/07:00016587
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	White-light interferometry; thickness of thin films (en)
http://linked.open.../riv/klicoveSlovo	thickness of thin films White-light interferometry
http://linked.open...odStatuVydavatele	SK - Slovenská republika
http://linked.open...ontrolniKodProRIV	[5EE58FAE9797]
http://linked.open...i/riv/nazevZdroje	Material Science and Technology
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Reflection and waveguiding effects in magnetic nanostructures
http://linked.open...UplatneniVysledku	2007
http://linked.open...v/svazekPeriodika	7
http://linked.open...iv/tvurceVysledku	Ciprian, Dalibor Hlubina, Petr Luňáček, Jiří Lesňák, Michal Chlebus, R.
http://linked.open...n/vavai/riv/zamer	Syntéza, struktura a vlastnosti nanomateriálů založených na bázi interkalovaných fylosylikátů
issn	1335-9053
number of pages	7 (xsd:int)
http://localhost/t...ganizacniJednotka	27350
is http://linked.open...avai/riv/vysledek of	White-light interferometric method to measure thickness of thin films White-light interferometric method to measure thickness of thin films White-light interferometric method to measure thickness of thin films

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