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Description
  • Spektrální interferometrie v bílém světle pro měření efektivní tloušťky optických elementů se známou disperzí (cs)
  • A spectral-domain white-light interferometric technique of measuring the effective thickness of optical elements of known dispersion is presented when a Michelson interferometer with a cube beam splitter is not dispersion balanced and when the spectral interference fringes are resolved over a wide wavelength range. The technique uses processing one of the recorded spectral interferograms by an adequate method to retrieve the unwrapped phase function, the ambiguity of which is removed by a simple procedure based on linear dependence of the optical path difference between interferometer beams on the refractive index of optical elements. The effective thickness of optical elements is given by the slope of the linear dependence. The technique is used to measure the effective thickness of a cube beam splitter alone or combined with a thin plate made of BK7 glass.
  • A spectral-domain white-light interferometric technique of measuring the effective thickness of optical elements of known dispersion is presented when a Michelson interferometer with a cube beam splitter is not dispersion balanced and when the spectral interference fringes are resolved over a wide wavelength range. The technique uses processing one of the recorded spectral interferograms by an adequate method to retrieve the unwrapped phase function, the ambiguity of which is removed by a simple procedure based on linear dependence of the optical path difference between interferometer beams on the refractive index of optical elements. The effective thickness of optical elements is given by the slope of the linear dependence. The technique is used to measure the effective thickness of a cube beam splitter alone or combined with a thin plate made of BK7 glass. (en)
Title
  • White-light spectral interferometry to measure the effective thickness of optical elements of known dispersion.
  • White-light spectral interferometry to measure the effective thickness of optical elements of known dispersion. (en)
  • Spektrální interferometrie v bílém světle pro měření efektivní tloušťky optických elementů se známou disperzí (cs)
skos:prefLabel
  • White-light spectral interferometry to measure the effective thickness of optical elements of known dispersion.
  • White-light spectral interferometry to measure the effective thickness of optical elements of known dispersion. (en)
  • Spektrální interferometrie v bílém světle pro měření efektivní tloušťky optických elementů se známou disperzí (cs)
skos:notation
  • RIV/61989100:27350/05:00013334!RIV06-GA0-27350___
http://linked.open.../vavai/riv/strany
  • 387-393
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA202/03/0776)
http://linked.open...iv/cisloPeriodika
  • 4
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 551411
http://linked.open...ai/riv/idVysledku
  • RIV/61989100:27350/05:00013334
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • white-light interferometry; dispersion (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • SK - Slovenská republika
http://linked.open...ontrolniKodProRIV
  • [FE9AD1D9375F]
http://linked.open...i/riv/nazevZdroje
  • Acta Physica Slovaca
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 55
http://linked.open...iv/tvurceVysledku
  • Hlubina, Petr
issn
  • 0323-0465
number of pages
http://localhost/t...ganizacniJednotka
  • 27350
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