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  • Jsou studovány dielektivické a optické vlastnosti tenkých vrstev PS a PMMA připravovaných z roztoku spinových povlaků. (cs)
  • About 1 mu m thick films of polystyrene (PS) and polymethylmethacrylate (PMMA) were prepared from solutions using spin-coating method. The PMMA films were doped with diphenylsulfoxide (DS) up to 45 wt%. Glass transition temperature (T-g) of doped PMMA films was determined by DSC technique and relative permittivity (epsilon) as a function of the sample temperature was determined from capacitance measurement. The dependence of polarization (P) on electric field (E) and the temperature was measured using a standard Sawyer-Tower circuit. Spectral dependence of film refractive index was measured using a refractometer. The glass transition temperature T-g of PMMA/DS composite was found to be decreasing function of the DS concentration. Relative permittivity epsilon of unpolar PS is lower than that of polar PMMA. The PS permittivity does not depend on the sample temperature. For PMMA the permittivity is increasing function of both, DS dopant concentration and sample temperature.
  • About 1 mu m thick films of polystyrene (PS) and polymethylmethacrylate (PMMA) were prepared from solutions using spin-coating method. The PMMA films were doped with diphenylsulfoxide (DS) up to 45 wt%. Glass transition temperature (T-g) of doped PMMA films was determined by DSC technique and relative permittivity (epsilon) as a function of the sample temperature was determined from capacitance measurement. The dependence of polarization (P) on electric field (E) and the temperature was measured using a standard Sawyer-Tower circuit. Spectral dependence of film refractive index was measured using a refractometer. The glass transition temperature T-g of PMMA/DS composite was found to be decreasing function of the DS concentration. Relative permittivity epsilon of unpolar PS is lower than that of polar PMMA. The PS permittivity does not depend on the sample temperature. For PMMA the permittivity is increasing function of both, DS dopant concentration and sample temperature. (en)
Title
  • Characterization of polystyrene and doped polymethylmethacrylate thin layers
  • Characterization of polystyrene and doped polymethylmethacrylate thin layers (en)
  • Charakteristiky tenkých vrstev polystyrenu a dopovaného polymethylmet krystalu (cs)
skos:prefLabel
  • Characterization of polystyrene and doped polymethylmethacrylate thin layers
  • Characterization of polystyrene and doped polymethylmethacrylate thin layers (en)
  • Charakteristiky tenkých vrstev polystyrenu a dopovaného polymethylmet krystalu (cs)
skos:notation
  • RIV/61389005:_____/05:00307936!RIV08-AV0-61389005
http://linked.open.../vavai/riv/strany
  • 761;765
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA106/03/0514), Z(AV0Z10480505)
http://linked.open...iv/cisloPeriodika
  • 11-12
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 515027
http://linked.open...ai/riv/idVysledku
  • RIV/61389005:_____/05:00307936
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • dielectrical properties (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [BC968F685E50]
http://linked.open...i/riv/nazevZdroje
  • Journal of Materials Science-Materials in Electronics
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 16
http://linked.open...iv/tvurceVysledku
  • Hnatowicz, Vladimír
  • Švorčík, V.
  • Hrabovská, E.
  • Podgrabinski, T.
http://linked.open...n/vavai/riv/zamer
issn
  • 0957-4522
number of pages
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