About: Plasma chemistry during the deposition of a-C : H films and its influence on film properties.     Goto   Sponge   NotDistinct   Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

AttributesValues
rdf:type
Description
  • Plasma chemistry in an argon/acetylene expanding thermal plasma was studied by means of a residual gas analyser (RGA) and cavity ring down spectroscopy (CRDS). With RGA, the consumption of acetylene in the plasma and the production of the C4H2 molecule was measured. CRDS was used for C, CH and C-2 radical detection. It is demonstrated that C, CH and C-2 are products of a secondary reaction chain of argon ions and electrons with radical products formed after the primary reaction of argon ions and electrons with acetylene. By increasing the acetylene injection the composition of the plasma, and consequently the film properties, can be controlled. The growth of the films was monitored using in situ real time single wavelength ellipsometry. Films were analysed with Rutherford backscattering combined with elastic recoil detection analysis and with ex situ spectroscopic ellipsometry. The film properties reflect clearly the different plasma composition. Possible consequences for hydrogenated amorphous carbon
  • Plasma chemistry in an argon/acetylene expanding thermal plasma was studied by means of a residual gas analyser (RGA) and cavity ring down spectroscopy (CRDS). With RGA, the consumption of acetylene in the plasma and the production of the C4H2 molecule was measured. CRDS was used for C, CH and C-2 radical detection. It is demonstrated that C, CH and C-2 are products of a secondary reaction chain of argon ions and electrons with radical products formed after the primary reaction of argon ions and electrons with acetylene. By increasing the acetylene injection the composition of the plasma, and consequently the film properties, can be controlled. The growth of the films was monitored using in situ real time single wavelength ellipsometry. Films were analysed with Rutherford backscattering combined with elastic recoil detection analysis and with ex situ spectroscopic ellipsometry. The film properties reflect clearly the different plasma composition. Possible consequences for hydrogenated amorphous carbon (en)
Title
  • Plasma chemistry during the deposition of a-C : H films and its influence on film properties.
  • Plasma chemistry during the deposition of a-C : H films and its influence on film properties. (en)
skos:prefLabel
  • Plasma chemistry during the deposition of a-C : H films and its influence on film properties.
  • Plasma chemistry during the deposition of a-C : H films and its influence on film properties. (en)
skos:notation
  • RIV/61389005:_____/03:49033067!RIV/2004/AV0/A49004/N
http://linked.open.../vavai/riv/strany
  • 90;97
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA104/03/0385), P(KSK4055109), Z(AV0Z1048901)
http://linked.open...iv/cisloPeriodika
  • 2
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 621033
http://linked.open...ai/riv/idVysledku
  • RIV/61389005:_____/03:49033067
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • plasma chemistry; spectroscopic ellipsometry (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • CH - Švýcarská konfederace
http://linked.open...ontrolniKodProRIV
  • [858A7F4FD156]
http://linked.open...i/riv/nazevZdroje
  • DIAMOND AND RELATED MATERIALS
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...ocetUcastnikuAkce
http://linked.open...nichUcastnikuAkce
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 12
http://linked.open...iv/tvurceVysledku
  • Hong, J.
  • Peřina, Vratislav
  • Benedikt, J.
  • Woen, R. V.
  • van Mensfoort, S. L. M.
  • van de Sanden, M. C. M.
http://linked.open...n/vavai/riv/zamer
issn
  • 0925-9635
number of pages
Faceted Search & Find service v1.16.118 as of Jun 21 2024


Alternative Linked Data Documents: ODE     Content Formats:   [cxml] [csv]     RDF   [text] [turtle] [ld+json] [rdf+json] [rdf+xml]     ODATA   [atom+xml] [odata+json]     Microdata   [microdata+json] [html]    About   
This material is Open Knowledge   W3C Semantic Web Technology [RDF Data] Valid XHTML + RDFa
OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 58 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software