About: Thin Organic Layers Diagnostics by Image Analysis

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Image processing has wide range of applications at field of a modern science. This presented work deals with thin organic layers diagnostic by image analysis. Thin layers were prepared by spin coating method. Solution of coated material in suitable volatile solvent is applied onto surface of a rotating substrate in this method. Solvent is evaporated and centrifuged. After finalization of the spinning process thin layer of coated material is created onto the substrate. Prepared thin layers were diagnosed by image analysis. Used instruments were optical microscope; digital camera and software NIS-Elements AR 2.30 type Advanced Research by Laboratory Imaging company. An image analysis technique was used to measure dependences of degree of coverage of the substrate surface on the concentration, the speed of rotation and the spinning time. Image processing has wide range of applications at field of a modern science. This presented work deals with thin organic layers diagnostic by image analysis. Thin layers were prepared by spin coating method. Solution of coated material in suitable volatile solvent is applied onto surface of a rotating substrate in this method. Solvent is evaporated and centrifuged. After finalization of the spinning process thin layer of coated material is created onto the substrate. Prepared thin layers were diagnosed by image analysis. Used instruments were optical microscope; digital camera and software NIS-Elements AR 2.30 type Advanced Research by Laboratory Imaging company. An image analysis technique was used to measure dependences of degree of coverage of the substrate surface on the concentration, the speed of rotation and the spinning time. (en)
Title	Thin Organic Layers Diagnostics by Image Analysis Thin Organic Layers Diagnostics by Image Analysis (en)
skos:prefLabel	Thin Organic Layers Diagnostics by Image Analysis Thin Organic Layers Diagnostics by Image Analysis (en)
skos:notation	RIV/60461373:22340/10:00023434!RIV11-MSM-22340___
http://linked.open...avai/riv/aktivita	S Z
http://linked.open...avai/riv/aktivity	S, Z(MSM6046137302), Z(MSM6046137306)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Ekrt, Ondřej Škodová, Jitka
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoká škola chemicko-technologická v Praze / Fakulta chemicko-inženýrská
http://linked.open...dnocenehoVysledku	292800
http://linked.open...ai/riv/idVysledku	RIV/60461373:22340/10:00023434
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	organic layers; image analysis (en)
http://linked.open.../riv/klicoveSlovo	organic layers image analysis
http://linked.open...ontrolniKodProRIV	[B83C2D5CD50C]
http://linked.open...v/mistoKonaniAkce	Kouty nad Desnou (CZ)
http://linked.open...i/riv/mistoVydani	Brno
http://linked.open...i/riv/nazevZdroje	Proceedings of 9th International Conference Process Control 2010
http://linked.open...in/vavai/riv/obor	JB
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Škodová, Jitka Ekrt, Ondřej
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2010-01-01 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Preparation and research of functional materials and material technologies using micro- and nanoscopic methods Reakčně-transportní chemicko-inženýrské systémy a jejich dynamické chování, modelování a řízení chemických a biotechnologických procesů
number of pages	1 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Tribun EU, s.r.o.
https://schema.org/isbn	978-80-7399-951-3
http://localhost/t...ganizacniJednotka	22340
is http://linked.open...avai/riv/vysledek of	Thin Organic Layers Diagnostics by Image Analysis Thin Organic Layers Diagnostics by Image Analysis Thin Organic Layers Diagnostics by Image Analysis

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