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  • Polyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40 keV Ni+ ions at room temperature at fluences ranging from 1.0 x 10(16) to 1.5 x 10(17) ions cm(-2) and with ion current density varying between 4 and 10 mu A cm(-2). The depth profiles of the implanted Ni atoms determined by the RBS technique were compared with those predicted by the SRIM and TRIDYN codes. Hydrogen depletion as a function of the ion fluence was determined by the ERDA technique, and the compositional and structural changes of the polymers were characterised by the UV-vis and XPS methods. The implanted profiles differed significantly from those predicted by the SRIM code while the lower fluences were satisfactorily described by the TRIDYN simulation. A significant hydrogen release from the polymer surface layer was observed along with significant changes in the surface layer composition. The UV-vis results indicated an increase in the concentration and conjugation of double bonds.
  • Polyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40 keV Ni+ ions at room temperature at fluences ranging from 1.0 x 10(16) to 1.5 x 10(17) ions cm(-2) and with ion current density varying between 4 and 10 mu A cm(-2). The depth profiles of the implanted Ni atoms determined by the RBS technique were compared with those predicted by the SRIM and TRIDYN codes. Hydrogen depletion as a function of the ion fluence was determined by the ERDA technique, and the compositional and structural changes of the polymers were characterised by the UV-vis and XPS methods. The implanted profiles differed significantly from those predicted by the SRIM code while the lower fluences were satisfactorily described by the TRIDYN simulation. A significant hydrogen release from the polymer surface layer was observed along with significant changes in the surface layer composition. The UV-vis results indicated an increase in the concentration and conjugation of double bonds. (en)
Title
  • Characterisation of Ni+ implanted PEEK, PET and PI
  • Characterisation of Ni+ implanted PEEK, PET and PI (en)
skos:prefLabel
  • Characterisation of Ni+ implanted PEEK, PET and PI
  • Characterisation of Ni+ implanted PEEK, PET and PI (en)
skos:notation
  • RIV/60461373:22310/09:00021552!RIV10-MSM-22310___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(KAN400480701), P(KJB100480601), P(LC06041), Z(AV0Z10480505), Z(MSM6046137302)
http://linked.open...iv/cisloPeriodika
  • 8-9
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 306742
http://linked.open...ai/riv/idVysledku
  • RIV/60461373:22310/09:00021552
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Ion implantation; Polymers; Depth profiles; TRIDYN; RBS; ERDA; UV-vis; XPS (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [FB5B14555195]
http://linked.open...i/riv/nazevZdroje
  • Nuclear Instruments and Methods in Physics Research, Section B
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 267
http://linked.open...iv/tvurceVysledku
  • Macková, Anna
  • Sajdl, Petr
  • Slepička, Petr
  • Švorčík, Václav
  • Bočan, J.
  • Khaibullin, R I.
  • Valeev, V F.
http://linked.open...ain/vavai/riv/wos
  • 000266519900083
http://linked.open...n/vavai/riv/zamer
issn
  • 0168-583X
number of pages
http://localhost/t...ganizacniJednotka
  • 22310
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