About: Preferred crystal orientation in Thin-Film nanocrystalline Silicon determined by Raman Spectroscopy     Goto   Sponge   NotDistinct   Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

AttributesValues
rdf:type
rdfs:seeAlso
Description
  • In this contribution, we report a unique approach of determining preferred orientation in hydrogenated thin film nanocrystalline silicon (nc-Si:H) using Polarized Raman Spectroscopy (PRS). This method is based on the fact that molecular vibrations in films under polarized light also give rise to polarization-dependent Raman scattered intensity depending on the grain crystal orientation of the irradiated material. First, the dependence of the Raman intensity of the 520 cm -1 TO peak on rotation angle is measured on (100), (110), and (111) single-crystalline silicon wafers
  • In this contribution, we report a unique approach of determining preferred orientation in hydrogenated thin film nanocrystalline silicon (nc-Si:H) using Polarized Raman Spectroscopy (PRS). This method is based on the fact that molecular vibrations in films under polarized light also give rise to polarization-dependent Raman scattered intensity depending on the grain crystal orientation of the irradiated material. First, the dependence of the Raman intensity of the 520 cm -1 TO peak on rotation angle is measured on (100), (110), and (111) single-crystalline silicon wafers (en)
Title
  • Preferred crystal orientation in Thin-Film nanocrystalline Silicon determined by Raman Spectroscopy
  • Preferred crystal orientation in Thin-Film nanocrystalline Silicon determined by Raman Spectroscopy (en)
skos:prefLabel
  • Preferred crystal orientation in Thin-Film nanocrystalline Silicon determined by Raman Spectroscopy
  • Preferred crystal orientation in Thin-Film nanocrystalline Silicon determined by Raman Spectroscopy (en)
skos:notation
  • RIV/49777513:23640/13:43919654!RIV14-MSM-23640___
http://linked.open...avai/predkladatel
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(1M06031), P(ED2.1.00/03.0088)
http://linked.open...iv/cisloPeriodika
  • 4
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 98797
http://linked.open...ai/riv/idVysledku
  • RIV/49777513:23640/13:43919654
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Polarized Raman spectroscopy; crystalline mass fraction; crystal orientation; Thin film nanocrystalline silicon (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • RO - Rumunsko
http://linked.open...ontrolniKodProRIV
  • [759E4F61FB6C]
http://linked.open...i/riv/nazevZdroje
  • Digest Journal of Nanomaterials and Biostructures
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 8
http://linked.open...iv/tvurceVysledku
  • Šutta, Pavol
  • Agbo, Solomon Nwabueze
issn
  • 1842-3582
number of pages
http://localhost/t...ganizacniJednotka
  • 23640
Faceted Search & Find service v1.16.118 as of Jun 21 2024


Alternative Linked Data Documents: ODE     Content Formats:   [cxml] [csv]     RDF   [text] [turtle] [ld+json] [rdf+json] [rdf+xml]     ODATA   [atom+xml] [odata+json]     Microdata   [microdata+json] [html]    About   
This material is Open Knowledge   W3C Semantic Web Technology [RDF Data] Valid XHTML + RDFa
OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 58 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software