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  • Two techniques of photothermal radiometry (PTR) in front face configuration were used to determine the thermal conductivity of thin nanocrystalline films. The first technique relies on using modulated laser beam as a heating source. The second is based on pulsed laser heating where the pulse can be assimilated to a Dirac function. In the two measurement setups, the infrared radiation emitted from the heated surface of the sample is measured by an infrared detector. The thermal conductivity of CrN thin films prepared with various thicknesses by magnetron sputtering on silicon substrates was investigated by both techniques showing a dependence on the film microstructure. The thermal resistance at the film-substrate interface and intrinsic thermal conductivity of the films were identified by the two techniques and the results are in a very good agreement.
  • Two techniques of photothermal radiometry (PTR) in front face configuration were used to determine the thermal conductivity of thin nanocrystalline films. The first technique relies on using modulated laser beam as a heating source. The second is based on pulsed laser heating where the pulse can be assimilated to a Dirac function. In the two measurement setups, the infrared radiation emitted from the heated surface of the sample is measured by an infrared detector. The thermal conductivity of CrN thin films prepared with various thicknesses by magnetron sputtering on silicon substrates was investigated by both techniques showing a dependence on the film microstructure. The thermal resistance at the film-substrate interface and intrinsic thermal conductivity of the films were identified by the two techniques and the results are in a very good agreement. (en)
Title
  • Using pulsed and modulated photothermal radiometry to measure the thermal conductivity of thin films
  • Using pulsed and modulated photothermal radiometry to measure the thermal conductivity of thin films (en)
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  • Using pulsed and modulated photothermal radiometry to measure the thermal conductivity of thin films
  • Using pulsed and modulated photothermal radiometry to measure the thermal conductivity of thin films (en)
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  • RIV/49777513:23640/13:43918229!RIV14-MSM-23640___
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  • P(ED2.1.00/03.0088)
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  • 1
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  • 113161
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  • RIV/49777513:23640/13:43918229
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  • thermal resistance; thin film; thermal conductivity; photothermal radiometry (en)
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  • NL - Nizozemsko
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  • [E6F1F4B084AA]
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  • THERMOCHIMICA ACTA
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  • 556
http://linked.open...iv/tvurceVysledku
  • Martan, Jiří
  • Battaglia, Jean-Luc
  • Daniel, Rostislav
  • Kusiak, Andrzej
issn
  • 0040-6031
number of pages
http://bibframe.org/vocab/doi
  • 10.1016/j.tca.2013.01.010
http://localhost/t...ganizacniJednotka
  • 23640
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