About: Hard multifunctional Hf-B-Si-C films prepared by pulsed magnetron sputtering     Goto   Sponge   NotDistinct   Permalink

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Description
  • Hf-B-Si-C films were deposited onto silicon and glass substrates using pulsed magnetron co-sputtering of a single B4C-Hf-Si target (at a fixed 15% Hf fraction and a varying 0-50% Si fraction in the target erosion area) in pure argon. We focus on the effect of the Si content in the films. The film structure changes from nanocolumnar (at 0-7 at.% of Si) to nanocomposite (at around 10 at.% of Si) to amorphous (at higher Si contents). Both nanocolumnar and nanocomposite HfB2-based films exhibit a hardness of up to 37 GPa and a high H/E* ratio of around 0.15. The Si incorporation leads to a significant reduction of the compressive stress of films and improvement of their oxidation resistance (unmeasurable mass change after annealing up to 800 °C at 35 at.% of Si). All films exhibit a high electrical conductivity and very smooth defect-free surfaces with an average roughness below 1 nm. Consequently, the films may be used as a new class of hard and electrically conductive protective coatings with a high oxidation resistance at elevated temperatures.
  • Hf-B-Si-C films were deposited onto silicon and glass substrates using pulsed magnetron co-sputtering of a single B4C-Hf-Si target (at a fixed 15% Hf fraction and a varying 0-50% Si fraction in the target erosion area) in pure argon. We focus on the effect of the Si content in the films. The film structure changes from nanocolumnar (at 0-7 at.% of Si) to nanocomposite (at around 10 at.% of Si) to amorphous (at higher Si contents). Both nanocolumnar and nanocomposite HfB2-based films exhibit a hardness of up to 37 GPa and a high H/E* ratio of around 0.15. The Si incorporation leads to a significant reduction of the compressive stress of films and improvement of their oxidation resistance (unmeasurable mass change after annealing up to 800 °C at 35 at.% of Si). All films exhibit a high electrical conductivity and very smooth defect-free surfaces with an average roughness below 1 nm. Consequently, the films may be used as a new class of hard and electrically conductive protective coatings with a high oxidation resistance at elevated temperatures. (en)
Title
  • Hard multifunctional Hf-B-Si-C films prepared by pulsed magnetron sputtering
  • Hard multifunctional Hf-B-Si-C films prepared by pulsed magnetron sputtering (en)
skos:prefLabel
  • Hard multifunctional Hf-B-Si-C films prepared by pulsed magnetron sputtering
  • Hard multifunctional Hf-B-Si-C films prepared by pulsed magnetron sputtering (en)
skos:notation
  • RIV/49777513:23520/14:43922810!RIV15-GA0-23520___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA14-03875S)
http://linked.open...iv/cisloPeriodika
  • 257
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 18774
http://linked.open...ai/riv/idVysledku
  • RIV/49777513:23520/14:43922810
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Oxidation resistance; Electrical conductivity; Hardness; Pulsed magnetron sputtering; Nanocomposite materials; Hf-B-Si-C films (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV
  • [A9FADFD343DC]
http://linked.open...i/riv/nazevZdroje
  • Surface and Coatings Technology
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 2014
http://linked.open...iv/tvurceVysledku
  • Houška, Jiří
  • Mareš, Pavel
  • Zeman, Petr
  • Vlček, Jaroslav
  • Čerstvý, Radomír
  • Kohout, Jiří
  • Jiang, Jiechao
  • Meletis, Efstathios I.
  • Zhang, Minghui
  • Zuzjaková, Šárka
http://linked.open...ain/vavai/riv/wos
  • 000344423100030
issn
  • 0257-8972
number of pages
http://bibframe.org/vocab/doi
  • 10.1016/j.surfcoat.2013.12.007
http://localhost/t...ganizacniJednotka
  • 23520
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