About: Random-Pattern Coverage Enhancement for BIST     Goto   Sponge   NotDistinct   Permalink

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Description
  • The paper presents a design method for Built-In Self Test (BIST) that uses a cellular automaton (CA) for test pattern generation. Similarly to the test pattern generators with linear feedback shift registers (LFSR) the CA can generate pseudorandom test patterns. The patterns correspond to code words or to linear combination of different code words of codes with non primitive irreducible polynomials and with higher minimal code distance of its dual code. The CA is formed by T flip-flops and does not contain any XOR in the feedback. We proposed a new scheme of BIST where the CA is formed by a modified scan chain. A number of experiments were done with ISCAS 85 and 89 benchmark circuits. The achieved fault coverage is better than that obtained with the help of patterns generated by LFSRs.
  • The paper presents a design method for Built-In Self Test (BIST) that uses a cellular automaton (CA) for test pattern generation. Similarly to the test pattern generators with linear feedback shift registers (LFSR) the CA can generate pseudorandom test patterns. The patterns correspond to code words or to linear combination of different code words of codes with non primitive irreducible polynomials and with higher minimal code distance of its dual code. The CA is formed by T flip-flops and does not contain any XOR in the feedback. We proposed a new scheme of BIST where the CA is formed by a modified scan chain. A number of experiments were done with ISCAS 85 and 89 benchmark circuits. The achieved fault coverage is better than that obtained with the help of patterns generated by LFSRs. (en)
Title
  • Random-Pattern Coverage Enhancement for BIST
  • Random-Pattern Coverage Enhancement for BIST (en)
skos:prefLabel
  • Random-Pattern Coverage Enhancement for BIST
  • Random-Pattern Coverage Enhancement for BIST (en)
skos:notation
  • RIV/46747885:24220/99:00000048!RIV/2000/MSM/242200
http://linked.open.../vavai/riv/strany
  • nečíslová
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/98/1003), P(VS96006), Z(MSM 242200002)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
  • Novák, Ondřej
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 751946
http://linked.open...ai/riv/idVysledku
  • RIV/46747885:24220/99:00000048
http://linked.open...riv/jazykVysledku
http://linked.open...ontrolniKodProRIV
  • [9B53801D9A9E]
http://linked.open...i/riv/mistoVydani
  • Německo
http://linked.open...i/riv/nazevZdroje
  • Proceedings of IEEE European Test Workshop
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Novák, Ondřej
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • IEEE
http://localhost/t...ganizacniJednotka
  • 24220
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