About: Pseudorandom,Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata

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Description	The paper presents a design method for Built-In Self Test (BIST) that uses a cellular automaton (CA) for test pattern generation. We have extensively studied the quality of generated patterns and we have found several interesting properties of them. The first possibility how to use the CA is to generate pseudoexhaustive test sets as the CA can generate code words of codes with higher minimal code distance of the dual code. There is no need of reseeding the CA in order to generate all the code wordsThe proposed CA can also generate weighted random patterns with different global weights which can be used instead of linear feedback shift register (LFSR) pseudorandom sequences, the fault coverage is higher. It can also be used as deterministic pattern compactor in mixed mode testing. Several experiments were done with ISCAS 85 and 89 benchmark circuits. We compared the quality of the generated test patterns with the quality of the patterns generated in an LFSR . The paper presents a design method for Built-In Self Test (BIST) that uses a cellular automaton (CA) for test pattern generation. We have extensively studied the quality of generated patterns and we have found several interesting properties of them. The first possibility how to use the CA is to generate pseudoexhaustive test sets as the CA can generate code words of codes with higher minimal code distance of the dual code. There is no need of reseeding the CA in order to generate all the code wordsThe proposed CA can also generate weighted random patterns with different global weights which can be used instead of linear feedback shift register (LFSR) pseudorandom sequences, the fault coverage is higher. It can also be used as deterministic pattern compactor in mixed mode testing. Several experiments were done with ISCAS 85 and 89 benchmark circuits. We compared the quality of the generated test patterns with the quality of the patterns generated in an LFSR . (en)
Title	Pseudorandom,Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata Pseudorandom,Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata (en)
skos:prefLabel	Pseudorandom,Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata Pseudorandom,Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata (en)
skos:notation	RIV/46747885:24220/99:00000045!RIV/2000/MSM/242200
http://linked.open.../vavai/riv/strany	303
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/98/1003), P(VS96006), Z(MSM 242200002)
http://linked.open...vai/riv/dodaniDat	2000
http://linked.open...aciTvurceVysledku	Novák, Ondřej
http://linked.open.../riv/druhVysledku	C - Kapitola v knize
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Technická univerzita v Liberci / Fakulta mechatroniky, informatiky a mezioborových studií
http://linked.open...dnocenehoVysledku	751684
http://linked.open...ai/riv/idVysledku	RIV/46747885:24220/99:00000045
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open...ontrolniKodProRIV	[DF38CD9BE41F]
http://linked.open...i/riv/mistoVydani	Berlin, Heidelberg, New York
http://linked.open...vEdiceCisloSvazku	vol. 166
http://linked.open...i/riv/nazevZdroje	Lecture Notes in Computer Science
http://linked.open...in/vavai/riv/obor	JC
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	1 (xsd:int)
http://linked.open...vavai/riv/projekt	Research and application of built-in self test equipment in integrated circuits Study of electromechanical properties of materials and their use in science and technology
http://linked.open...UplatneniVysledku	1999
http://linked.open...iv/tvurceVysledku	Novák, Ondřej
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20242200002
number of pages	18 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Springer-Verlag
https://schema.org/isbn	3-540-66483-1
http://localhost/t...ganizacniJednotka	24220

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