About: On test time reduction using pattern overlapping, broadcasting and on-chip decompression

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The paper deals with the problem of test data volume, test application time and on-chip test decompressor hardware overhead of scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction and low decompressor hardware requirements. This paper presents a new test compression and test application approach that combines both the test pattern overlapping technique and the test pattern broadcasting technique. This new technique significantly reduces test application time by utilizing a new on-chip test decompressor architecture presented in this paper The paper deals with the problem of test data volume, test application time and on-chip test decompressor hardware overhead of scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction and low decompressor hardware requirements. This paper presents a new test compression and test application approach that combines both the test pattern overlapping technique and the test pattern broadcasting technique. This new technique significantly reduces test application time by utilizing a new on-chip test decompressor architecture presented in this paper (en)
Title	On test time reduction using pattern overlapping, broadcasting and on-chip decompression On test time reduction using pattern overlapping, broadcasting and on-chip decompression (en)
skos:prefLabel	On test time reduction using pattern overlapping, broadcasting and on-chip decompression On test time reduction using pattern overlapping, broadcasting and on-chip decompression (en)
skos:notation	RIV/46747885:24220/12:#0002012!RIV13-MSM-24220___
http://linked.open...avai/predkladatel	Fakulta mechatroniky, informatiky a mezioborových studií
http://linked.open...avai/riv/aktivita	S
http://linked.open...avai/riv/aktivity	S
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Jeníček, J. Novák, Ondřej
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Technická univerzita v Liberci / Fakulta mechatroniky, informatiky a mezioborových studií
http://linked.open...dnocenehoVysledku	156347
http://linked.open...ai/riv/idVysledku	RIV/46747885:24220/12:#0002012
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	broadcasting (en)
http://linked.open.../riv/klicoveSlovo	broadcasting
http://linked.open...ontrolniKodProRIV	[51DD5FC3695F]
http://linked.open...v/mistoKonaniAkce	Tallinn, ESTONIA
http://linked.open...i/riv/nazevZdroje	IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems
http://linked.open...in/vavai/riv/obor	JC
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...UplatneniVysledku	2012
http://linked.open...iv/tvurceVysledku	Chloupek, M. Jeníček, Jiří Novák, Ondřej
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open...ain/vavai/riv/wos	000312905700071
http://linked.open.../riv/zahajeniAkce	2012-04-18 (xsd:date)
number of pages	6 (xsd:int)
http://bibframe.org/vocab/doi	10.1109/DDECS.2012.6219078
http://purl.org/ne...btex#hasPublisher	IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
https://schema.org/isbn	978-1-4673-1187-8
http://localhost/t...ganizacniJednotka	24220
is http://linked.open...avai/riv/vysledek of	On test time reduction using pattern overlapping, broadcasting and on-chip decompression

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