The test pattern compaction method combined with test input data compression technique for the RESPIN architecture is presented. RESPIN architecture is compatible with the IEEE 1500 standard and can be implemented in complex SoCs.
The test pattern compaction method combined with test input data compression technique for the RESPIN architecture is presented. RESPIN architecture is compatible with the IEEE 1500 standard and can be implemented in complex SoCs. (en)
Článek představuje kompaktní metodu s kombinací kompresní techniky, která připravuje komprimované testovací vzorky pro RESPIN architekturu. RESPIN architektura je kompatibilní se standardem IEEE 1500. (cs)