About: Test Pattern Decompression Technique for Circuits with Scan

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
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Description	The paper describes test pattern decompression technique for circuits with scan The paper describes test pattern decompression technique for circuits with scan (en)
Title	Test Pattern Decompression Technique for Circuits with Scan Test Pattern Decompression Technique for Circuits with Scan (en)
skos:prefLabel	Test Pattern Decompression Technique for Circuits with Scan Test Pattern Decompression Technique for Circuits with Scan (en)
skos:notation	RIV/46747885:24220/03:00000044!RIV/2004/GA0/242204/N
http://linked.open.../vavai/riv/strany	103-104
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(GA102/01/0566)
http://linked.open...vai/riv/dodaniDat	2004
http://linked.open...aciTvurceVysledku	Zahrádka, Jiří Novák, Ondřej
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Technická univerzita v Liberci / Fakulta mechatroniky, informatiky a mezioborových studií
http://linked.open...dnocenehoVysledku	630699
http://linked.open...ai/riv/idVysledku	RIV/46747885:24220/03:00000044
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	%22diagnostics; test%22 (en)
http://linked.open.../riv/klicoveSlovo	test%22 %22diagnostics
http://linked.open...ontrolniKodProRIV	[DF52E18A78E2]
http://linked.open...v/mistoKonaniAkce	Maastricht, Netherlands
http://linked.open...i/riv/mistoVydani	Netherlands
http://linked.open...i/riv/nazevZdroje	Proc. of IEEE ETW 2003
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...vavai/riv/projekt	Built-in self test equipment optimisation methods in integrated circuits
http://linked.open...UplatneniVysledku	2003
http://linked.open...iv/tvurceVysledku	Novák, Ondřej Zahrádka, Jiří
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2003-01-01 (xsd:date)
number of pages	2 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Philips Research, IEEE
http://localhost/t...ganizacniJednotka	24220

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