About: Test-per-Clock Testing of the Circuits with Scan

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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Description	The article describes Test-per-Clock Testing of the Circuits with Scan. The article describes Test-per-Clock Testing of the Circuits with Scan. (en)
Title	Test-per-Clock Testing of the Circuits with Scan Test-per-Clock Testing of the Circuits with Scan (en)
skos:prefLabel	Test-per-Clock Testing of the Circuits with Scan Test-per-Clock Testing of the Circuits with Scan (en)
skos:notation	RIV/46747885:24220/01:00000026!RIV/2002/MSM/242202/N
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http://linked.open...vai/riv/dodaniDat	2002
http://linked.open...aciTvurceVysledku	Nosek, Jiří Novák, Ondřej
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Technická univerzita v Liberci / Fakulta mechatroniky, informatiky a mezioborových studií
http://linked.open...dnocenehoVysledku	698616
http://linked.open...ai/riv/idVysledku	RIV/46747885:24220/01:00000026
http://linked.open...riv/jazykVysledku	eng - angličtina
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http://linked.open...v/mistoKonaniAkce	Taormina, Italy
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http://linked.open...i/riv/nazevZdroje	Proc. of 7th IEEE International On-Line Testing Workshop
http://linked.open...in/vavai/riv/obor	JC
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http://linked.open...vavai/riv/projekt	Built-in self test equipment optimisation methods in integrated circuits
http://linked.open...UplatneniVysledku	2001
http://linked.open...iv/tvurceVysledku	Novák, Ondřej Nosek, Jiří
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https://schema.org/isbn	0-7695-1290-9
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