About: Built-In Self Test From Hardware Point of View     Goto   Sponge   NotDistinct   Permalink

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  • In this paper we present experiences with BISTE (Built-In Self Test Equipment) from hardware point-of-view. Circuit scheme consists of the CUT (Circuit Under Test), TPG (Test Pattern Generator - part of the BIST which prepares test patterns and forces itAll these parts have an influence on the dimensions of the final IC. Different test techniques have different hardware overhead demands. We have done the comparison of the basic flip-flops (FF), which we have used for the TPG design. We also demonstrate an influence of the used BISTE technique to the hardware overhead.
  • In this paper we present experiences with BISTE (Built-In Self Test Equipment) from hardware point-of-view. Circuit scheme consists of the CUT (Circuit Under Test), TPG (Test Pattern Generator - part of the BIST which prepares test patterns and forces itAll these parts have an influence on the dimensions of the final IC. Different test techniques have different hardware overhead demands. We have done the comparison of the basic flip-flops (FF), which we have used for the TPG design. We also demonstrate an influence of the used BISTE technique to the hardware overhead. (en)
Title
  • Built-In Self Test From Hardware Point of View
  • Built-In Self Test From Hardware Point of View (en)
skos:prefLabel
  • Built-In Self Test From Hardware Point of View
  • Built-In Self Test From Hardware Point of View (en)
skos:notation
  • RIV/46747885:24220/01:00000009!RIV/2002/MSM/242202/N
http://linked.open.../vavai/riv/strany
  • 131-135
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/01/0566), Z(MSM 242200002)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 674772
http://linked.open...ai/riv/idVysledku
  • RIV/46747885:24220/01:00000009
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • %22Hardware overhead; BIST%22 (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [52202AD0C932]
http://linked.open...v/mistoKonaniAkce
  • Toulouse
http://linked.open...i/riv/mistoVydani
  • Toulouse, France
http://linked.open...i/riv/nazevZdroje
  • 5th Workshop on Electronics, Control, Modelling, Measurment and Signals
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...ocetUcastnikuAkce
http://linked.open...nichUcastnikuAkce
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Novák, Ondřej
  • Plíva, Zdeněk
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • Universite Paul Sabatier
http://localhost/t...ganizacniJednotka
  • 24220
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