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About:
An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain
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An Entity of Type :
http://linked.opendata.cz/ontology/domain/vavai/Vysledek
, within Data Space :
linked.opendata.cz
associated with source
document(s)
Type:
skos:Concept
http://linked.opendata.cz/ontology/domain/vavai/Vysledek
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rdf:type
skos:Concept
http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description
An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain
An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain
(en)
Title
An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain
An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain
(en)
skos:prefLabel
An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain
An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain
(en)
skos:notation
RIV/46747885:24220/00:00000029!RIV/2001/MSM/242201/N
http://linked.open.../vavai/riv/strany
305
http://linked.open...avai/riv/aktivita
P
Z
http://linked.open...avai/riv/aktivity
P(VS96006), Z(MSM 242200002)
http://linked.open...vai/riv/dodaniDat
2001
http://linked.open...aciTvurceVysledku
Novák, Ondrej
http://linked.open.../riv/druhVysledku
D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju
S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele
Technická univerzita v Liberci / Fakulta mechatroniky, informatiky a mezioborových studií
http://linked.open...dnocenehoVysledku
704331
http://linked.open...ai/riv/idVysledku
RIV/46747885:24220/00:00000029
http://linked.open...riv/jazykVysledku
eng - angličtina
http://linked.open.../riv/klicovaSlova
IC design
(en)
http://linked.open.../riv/klicoveSlovo
IC design
http://linked.open...ontrolniKodProRIV
[41C3336004EE]
http://linked.open...i/riv/mistoVydani
Lisbon (Portugal)
http://linked.open...i/riv/nazevZdroje
Proc. of IEEE European Test Workshop (ETW´00)
http://linked.open...in/vavai/riv/obor
JA
http://linked.open...ichTvurcuVysledku
1
(
xsd:int
)
http://linked.open...cetTvurcuVysledku
2
(
xsd:int
)
http://linked.open...vavai/riv/projekt
Study of electromechanical properties of materials and their use in science and technology
http://linked.open...UplatneniVysledku
2000
http://linked.open...iv/tvurceVysledku
Novák, Ondrej
http://linked.open...n/vavai/riv/zamer
http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20242200002
number of pages
2
(
xsd:int
)
http://purl.org/ne...btex#hasPublisher
IEEE
http://localhost/t...ganizacniJednotka
24220
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