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  • Secondary and backscaterred electrons are the most common signals used for imaging in the scanning electron microscopy. Generally, SE are used to obtain topographical contrast while BSE show differences in chemical composition (so called Z-contrast).The aim of the present work is to show possibilities and techniques to obtain not-so-common information using BSE, as e.g. orientation contrast, residual stress, different allotropic modifications, etc.
  • Secondary and backscaterred electrons are the most common signals used for imaging in the scanning electron microscopy. Generally, SE are used to obtain topographical contrast while BSE show differences in chemical composition (so called Z-contrast).The aim of the present work is to show possibilities and techniques to obtain not-so-common information using BSE, as e.g. orientation contrast, residual stress, different allotropic modifications, etc. (en)
Title
  • The usage of backscattered electrons in scanning electron microscopy
  • The usage of backscattered electrons in scanning electron microscopy (en)
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  • The usage of backscattered electrons in scanning electron microscopy
  • The usage of backscattered electrons in scanning electron microscopy (en)
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  • RIV/46747885:24210/14:#0006418!RIV15-MSM-24210___
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  • P(LO1201)
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  • 52208
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  • RIV/46747885:24210/14:#0006418
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  • Scanning Electron Microscopy; BSE; Structure (en)
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  • [45DD160B2703]
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  • Ústí n.L.
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  • 3. mezinárodní konference NDT 2014 : Mikroskopie a nedestruktivní zkoušení materiálů 2014
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  • Švec, Martin
  • Kejzlar, Pavel
  • Macajová, Eva
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  • Univerzita Jana Evangelisty Purkyně v Ústí nad Labem
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  • 978-80-7414-755-5
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  • 24210
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