About: Single layer and multilayered films of plasma polymers analyzed by nanoindentation and spectroscopic ellipsometry     Goto   Sponge   NotDistinct   Permalink

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  • Well-defined single layer and multilayered a-SiC:H films, deposited from tetravinylsilane at different powers by plasma-enhanced chemical vapor deposition on silicon, were intensively studied by in situ spectroscopic ellipsometry, nanoindentation, and atomic force microscopy. A realistic model of the sample structure was used to analyze ellipsometric data and distinguish individual layers in the multilayered film, evaluate their thickness and optical constants. Dispersion dependences for the refractive index were well separated for each type of individual layer, if the thickness was decreased 315 - 25 nm, and corresponded to those of the single layer. A beveled section of the multilayered film revealed the individual layers that were investigated by atomic force microscopy and nanoindentation to confirm that mechanical properties in multilayered and single layer films are similar.
  • Well-defined single layer and multilayered a-SiC:H films, deposited from tetravinylsilane at different powers by plasma-enhanced chemical vapor deposition on silicon, were intensively studied by in situ spectroscopic ellipsometry, nanoindentation, and atomic force microscopy. A realistic model of the sample structure was used to analyze ellipsometric data and distinguish individual layers in the multilayered film, evaluate their thickness and optical constants. Dispersion dependences for the refractive index were well separated for each type of individual layer, if the thickness was decreased 315 - 25 nm, and corresponded to those of the single layer. A beveled section of the multilayered film revealed the individual layers that were investigated by atomic force microscopy and nanoindentation to confirm that mechanical properties in multilayered and single layer films are similar. (en)
Title
  • Single layer and multilayered films of plasma polymers analyzed by nanoindentation and spectroscopic ellipsometry
  • Single layer and multilayered films of plasma polymers analyzed by nanoindentation and spectroscopic ellipsometry (en)
skos:prefLabel
  • Single layer and multilayered films of plasma polymers analyzed by nanoindentation and spectroscopic ellipsometry
  • Single layer and multilayered films of plasma polymers analyzed by nanoindentation and spectroscopic ellipsometry (en)
skos:notation
  • RIV/00216305:26310/09:PU84416!RIV10-MSM-26310___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA104/06/0437), P(KAN101120701), Z(MSM0021630501)
http://linked.open...iv/cisloPeriodika
  • 21
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 341416
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26310/09:PU84416
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Multilayers, Plasma processing and deposition, Ellipsometry, Atomic force microscopy (AFM) (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [E7EAE9914ADD]
http://linked.open...i/riv/nazevZdroje
  • Thin Solid Films
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 517
http://linked.open...iv/tvurceVysledku
  • Studýnka, Jan
  • Čech, Vladimír
  • Trivedi, Rutul Rajendra
  • Čechalová, Božena
http://linked.open...n/vavai/riv/zamer
issn
  • 0040-6090
number of pages
http://localhost/t...ganizacniJednotka
  • 26310
is http://linked.open...avai/riv/vysledek of
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