About: Low Power Testing

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Portable computer systems and embedded systems are examples of electronic devices which are powered from batteries, therefore they are designed with the goal of low power consumption. Low power consumption becomes important not only during normal operational mode but during test application as well when switching activity is higher than in normal mode. In this chapter, a survey of basic concepts and methodologies from the area of low power testing is provided. First, it is explained how power consumption is related to switching activities during test application. Then, the concepts of static and dynamic power consumption are discussed together with metrics which can be possibly used to evaluate power consumption. The survey of methods the goal of which is to reduce dynamic power consumption during test application is then provided followed by a short survey of power-constrained test scheduling methods. Portable computer systems and embedded systems are examples of electronic devices which are powered from batteries, therefore they are designed with the goal of low power consumption. Low power consumption becomes important not only during normal operational mode but during test application as well when switching activity is higher than in normal mode. In this chapter, a survey of basic concepts and methodologies from the area of low power testing is provided. First, it is explained how power consumption is related to switching activities during test application. Then, the concepts of static and dynamic power consumption are discussed together with metrics which can be possibly used to evaluate power consumption. The survey of methods the goal of which is to reduce dynamic power consumption during test application is then provided followed by a short survey of power-constrained test scheduling methods. (en)
Title	Low Power Testing Low Power Testing (en)
skos:prefLabel	Low Power Testing Low Power Testing (en)
skos:notation	RIV/00216305:26230/12:PU103011!RIV13-MSM-26230___
http://linked.open...avai/predkladatel	Fakulta informačních technologií
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(MSM0021630528)
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Kotásek, Zdeněk Škarvada, Jaroslav
http://linked.open.../riv/druhVysledku	C - Kapitola v knize
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta informačních technologií
http://linked.open...dnocenehoVysledku	147504
http://linked.open...ai/riv/idVysledku	RIV/00216305:26230/12:PU103011
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	power consumption, low power testing (en)
http://linked.open.../riv/klicoveSlovo	power consumption low power testing
http://linked.open...ontrolniKodProRIV	[40C38F2B4FB9]
http://linked.open...i/riv/mistoVydani	Hershey
http://linked.open...vEdiceCisloSvazku	NEUVEDEN
http://linked.open...i/riv/nazevZdroje	Design and Test Technology foír Dependable Systems-on-Chip
http://linked.open...in/vavai/riv/obor	IN
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...v/pocetStranKnihy	550 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...UplatneniVysledku	2012
http://linked.open...iv/tvurceVysledku	Kotásek, Zdeněk Škarvada, Jaroslav
http://linked.open...n/vavai/riv/zamer	Výzkum informačních technologií z hlediska bezpečnosti
number of pages	18 (xsd:int)
http://purl.org/ne...btex#hasPublisher	IGI Global
https://schema.org/isbn	978-1-60960-212-3
http://localhost/t...ganizacniJednotka	26230
is http://linked.open...avai/riv/vysledek of	Low Power Testing

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