About: Behavior of CMOS Polymorphic Circuits in High Temperature Environment

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Description	The paper describes a series of experiments performed with the aim to analyze the fundamental impact of high temperatures on behavior of polymorphic digital circuits. These experiments were conducted using a reconfigurable polymorphic chip REPOMO32 which is configured (in addition to the configuration bit stream) using the level of power supply voltage (Vdd). Experiments show that polymorphic gates in the chip can be easily involved (in terms of functionality) not only by Vdd, but also by temperature. Because experiments also prove that the physical design of the REPOMO32 chip is robust enough to keep the functionality of all circuitry of the REPOMO32 and its dynamic parameters are stable enough under wide range of operating temperature, the chip can also be used for future designs of digital polymorphic circuits controlled by temperature. The paper describes a series of experiments performed with the aim to analyze the fundamental impact of high temperatures on behavior of polymorphic digital circuits. These experiments were conducted using a reconfigurable polymorphic chip REPOMO32 which is configured (in addition to the configuration bit stream) using the level of power supply voltage (Vdd). Experiments show that polymorphic gates in the chip can be easily involved (in terms of functionality) not only by Vdd, but also by temperature. Because experiments also prove that the physical design of the REPOMO32 chip is robust enough to keep the functionality of all circuitry of the REPOMO32 and its dynamic parameters are stable enough under wide range of operating temperature, the chip can also be used for future designs of digital polymorphic circuits controlled by temperature. (en)
Title	Behavior of CMOS Polymorphic Circuits in High Temperature Environment Behavior of CMOS Polymorphic Circuits in High Temperature Environment (en)
skos:prefLabel	Behavior of CMOS Polymorphic Circuits in High Temperature Environment Behavior of CMOS Polymorphic Circuits in High Temperature Environment (en)
skos:notation	RIV/00216305:26230/11:PU96029!RIV12-MSM-26230___
http://linked.open...avai/predkladatel	Fakulta informačních technologií
http://linked.open...avai/riv/aktivita	P S Z
http://linked.open...avai/riv/aktivity	P(GAP103/10/1517), S, Z(MSM0021630528)
http://linked.open...vai/riv/dodaniDat	2012
http://linked.open...aciTvurceVysledku	Sekanina, Lukáš Růžička, Richard Šimek, Václav
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta informačních technologií
http://linked.open...dnocenehoVysledku	187945
http://linked.open...ai/riv/idVysledku	RIV/00216305:26230/11:PU96029
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Polymorphic digital circuits, polymorphic gates, reconfigurable circuits, temperature-aware design. (en)
http://linked.open.../riv/klicoveSlovo	Polymorphic digital circuits polymorphic gates reconfigurable circuits temperature-aware design.
http://linked.open...ontrolniKodProRIV	[D9F7CC80EC1B]
http://linked.open...v/mistoKonaniAkce	Cottbus
http://linked.open...i/riv/mistoVydani	Cottbus
http://linked.open...i/riv/nazevZdroje	Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
http://linked.open...in/vavai/riv/obor	JC
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Natural Computing on Unconventional Platforms
http://linked.open...UplatneniVysledku	2011
http://linked.open...iv/tvurceVysledku	Růžička, Richard Sekanina, Lukáš Šimek, Václav
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2011-04-13 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Výzkum informačních technologií z hlediska bezpečnosti
number of pages	6 (xsd:int)
http://purl.org/ne...btex#hasPublisher	IEEE Computer Society
https://schema.org/isbn	978-1-4244-9753-9
http://localhost/t...ganizacniJednotka	26230
is http://linked.open...avai/riv/vysledek of	Behavior of CMOS Polymorphic Circuits in High Temperature Environment Behavior of CMOS Polymorphic Circuits in High Temperature Environment

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