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rdf:type
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Description
| - In this paper, a new concept which allows the reduction of test vectors volume is presented. The concept is based on reconfiguration of some gates of circuit under test. Instead of testing the original circuit, a circuit which has the same topology (but some of its gate functions are reconfigured) is actually tested. Two possible implementations of the reconfiguration are investigated. Preliminary experiments indicate that test length can be reduced to approx. 70% of its initial value while the increase in transistors is moderate.
- In this paper, a new concept which allows the reduction of test vectors volume is presented. The concept is based on reconfiguration of some gates of circuit under test. Instead of testing the original circuit, a circuit which has the same topology (but some of its gate functions are reconfigured) is actually tested. Two possible implementations of the reconfiguration are investigated. Preliminary experiments indicate that test length can be reduced to approx. 70% of its initial value while the increase in transistors is moderate. (en)
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Title
| - Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration
- Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration (en)
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skos:prefLabel
| - Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration
- Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration (en)
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skos:notation
| - RIV/00216305:26230/08:PU76700!RIV10-MSM-26230___
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(GA102/06/0599), Z(MSM0021630528)
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26230/08:PU76700
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - digital circuit, test vector, reconfiguration (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...v/mistoKonaniAkce
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http://linked.open...i/riv/mistoVydani
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http://linked.open...i/riv/nazevZdroje
| - Proc. of 2008 IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Kotásek, Zdeněk
- Sekanina, Lukáš
- Stareček, Lukáš
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http://linked.open...vavai/riv/typAkce
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http://linked.open.../riv/zahajeniAkce
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http://linked.open...n/vavai/riv/zamer
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number of pages
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http://purl.org/ne...btex#hasPublisher
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https://schema.org/isbn
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http://localhost/t...ganizacniJednotka
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is http://linked.open...avai/riv/vysledek
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