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  • In this paper, a new concept which allows the reduction of test vectors volume is presented. The concept is based on reconfiguration of some gates of circuit under test. Instead of testing the original circuit, a circuit which has the same topology (but some of its gate functions are reconfigured) is actually tested. Two possible implementations of the reconfiguration are investigated. Preliminary experiments indicate that test length can be reduced to approx. 70% of its initial value while the increase in transistors is moderate.
  • In this paper, a new concept which allows the reduction of test vectors volume is presented. The concept is based on reconfiguration of some gates of circuit under test. Instead of testing the original circuit, a circuit which has the same topology (but some of its gate functions are reconfigured) is actually tested. Two possible implementations of the reconfiguration are investigated. Preliminary experiments indicate that test length can be reduced to approx. 70% of its initial value while the increase in transistors is moderate. (en)
Title
  • Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration
  • Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration (en)
skos:prefLabel
  • Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration
  • Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration (en)
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  • RIV/00216305:26230/08:PU76700!RIV10-MSM-26230___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/06/0599), Z(MSM0021630528)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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http://linked.open...dnocenehoVysledku
  • 391855
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26230/08:PU76700
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • digital circuit, test vector, reconfiguration (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [099BD91A90FF]
http://linked.open...v/mistoKonaniAkce
  • Bratislava
http://linked.open...i/riv/mistoVydani
  • Bratislava
http://linked.open...i/riv/nazevZdroje
  • Proc. of 2008 IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop
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http://linked.open...ichTvurcuVysledku
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http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Kotásek, Zdeněk
  • Sekanina, Lukáš
  • Stareček, Lukáš
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
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  • IEEE Computer Society
https://schema.org/isbn
  • 978-1-4244-2276-0
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  • 26230
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