About: Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level

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About: Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In the paper a new heuristic approach to the RTL testability analysis is presented. It is shown how the values of controllability/observability factors reflecting the structure of the circuit and other factors can be utilised to find solutions which are sub-optimal but still acceptable for the designer. The goal of the methodology is to enable the identification of such testability solutions which satisfy concrete requirements in terms of the number of registers included into the scan chain, the area ooverhead and the test application time as a result of RTL testability analysis. The approach is based on the combination of analytical and evolutionary approaches at the RT level. In the paper a new heuristic approach to the RTL testability analysis is presented. It is shown how the values of controllability/observability factors reflecting the structure of the circuit and other factors can be utilised to find solutions which are sub-optimal but still acceptable for the designer. The goal of the methodology is to enable the identification of such testability solutions which satisfy concrete requirements in terms of the number of registers included into the scan chain, the area ooverhead and the test application time as a result of RTL testability analysis. The approach is based on the combination of analytical and evolutionary approaches at the RT level. (en)
Title	Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level (en)
skos:prefLabel	Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level (en)
skos:notation	RIV/00216305:26230/02:PU36249!RIV/2003/GA0/262303/N
http://linked.open.../vavai/riv/strany	166-173
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/01/1531), Z(MSM 262200012)
http://linked.open...vai/riv/dodaniDat	2003
http://linked.open...aciTvurceVysledku	Kotásek, Zdeněk Strnadel, Josef
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta informačních technologií
http://linked.open...dnocenehoVysledku	666751
http://linked.open...ai/riv/idVysledku	RIV/00216305:26230/02:PU36249
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	design for testability, scan technique, scan register, scan chain, state-space analysis, evolutionary approach, genetic algorithm (en)
http://linked.open.../riv/klicoveSlovo	evolutionary approach genetic algorithm scan chain scan register design for testability scan technique state-space analysis
http://linked.open...ontrolniKodProRIV	[C821DD8BC5CA]
http://linked.open...v/mistoKonaniAkce	Dortmund
http://linked.open...i/riv/mistoVydani	Los Alamitos
http://linked.open...i/riv/nazevZdroje	Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002
http://linked.open...in/vavai/riv/obor	JC
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...vavai/riv/projekt	Formal approaches in digital circuit diagnostics - testable design verification
http://linked.open...UplatneniVysledku	2002
http://linked.open...iv/tvurceVysledku	Kotásek, Zdeněk Strnadel, Josef
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2002-09-04 (xsd:date)
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20262200012
number of pages	8 (xsd:int)
http://purl.org/ne...btex#hasPublisher	IEEE Computer Society Press
https://schema.org/isbn	0-7695-1790-0
http://localhost/t...ganizacniJednotka	26230

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