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Description
| - The article deals with photo-reflective layer on Low-Temperature Co-Fired Ceramic substrate deposition. Measurement of diffusion and specular reflectance and roughness of layer is included. Fabrication process and its optimization is also mentioned. For measurement of deposited layer optical properties, spectrometric method in spherical chamber was used. Further, profile of layers surface was measured by profilometer to acquire dependence between roughness and reflectivity. The main aim of work is to map the possibility of creation of photo-reflective layer on electrical, chemical and thermal resistant substrate in simple way.
- The article deals with photo-reflective layer on Low-Temperature Co-Fired Ceramic substrate deposition. Measurement of diffusion and specular reflectance and roughness of layer is included. Fabrication process and its optimization is also mentioned. For measurement of deposited layer optical properties, spectrometric method in spherical chamber was used. Further, profile of layers surface was measured by profilometer to acquire dependence between roughness and reflectivity. The main aim of work is to map the possibility of creation of photo-reflective layer on electrical, chemical and thermal resistant substrate in simple way. (en)
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Title
| - Photo-reflective layer on Low Temperature Co-fired Ceramic for optical applications
- Photo-reflective layer on Low Temperature Co-fired Ceramic for optical applications (en)
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skos:prefLabel
| - Photo-reflective layer on Low Temperature Co-fired Ceramic for optical applications
- Photo-reflective layer on Low Temperature Co-fired Ceramic for optical applications (en)
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skos:notation
| - RIV/00216305:26220/13:PU106997!RIV14-MSM-26220___
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http://linked.open...avai/predkladatel
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26220/13:PU106997
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - LTCC, thick-film, thin-film, diffusion and specular reflectance, roughness, surface. (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - CH - Švýcarská konfederace
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - Key Engineering Materials (print)
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Hubálek, Jaromír
- Szendiuch, Ivan
- Urban, František
- Svatoš, Vojtěch
- Klíma, Martin
- Holík, Milan
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issn
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number of pages
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http://bibframe.org/vocab/doi
| - 10.4028/www.scientific.net/KEM.592-593.457
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http://localhost/t...ganizacniJednotka
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