About: Effect of High Operating Temperature on Electrcal Quantities of CdTe Radiation Detectors

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Analysis electrical properties change of a semiconductor radiation detector, based on Cadmium-Telluride material has been carried out. The detector was exposed to temperature 100 C for time period of 24 hours. Heat stress caused an increase of leakage currents by two orders. New defect energy levels caused difference in detector current transit, typical for the polarization effect. The noise spectral density of the detector after thermal stressing increases with the power of 6.81, which is significantly higher value than 2.70, measured before thermal stressing. (en) Analysis electrical properties change of a semiconductor radiation detector, based on Cadmium-Telluride material has been carried out. The detector was exposed to temperature 100C for time period of 24 hours. Heat stress caused an increase of leakage currents by two orders. New defect energy levels caused difference in detector current transit, typical for the polarization effect. The noise spectral density of the detector after thermal stressing increases with the power of 6.81, which is significantly higher value than 2.70, measured before thermal stressing. Analysis electrical properties change of a semiconductor radiation detector, based on Cadmium-Telluride material has been carried out. The detector was exposed to temperature 100C for time period of 24 hours. Heat stress caused an increase of leakage currents by two orders. New defect energy levels caused difference in detector current transit, typical for the polarization effect. The noise spectral density of the detector after thermal stressing increases with the power of 6.81, which is significantly higher value than 2.70, measured before thermal stressing. (cs)
Title	Effect of High Operating Temperature on Electrcal Quantities of CdTe Radiation Detectors Effect of High Operating Temperature on Electrcal Quantities of CdTe Radiation Detectors (en) Effect of High Operating Temperature on Electrcal Quantities of CdTe Radiation Detectors (cs)
skos:prefLabel	Effect of High Operating Temperature on Electrcal Quantities of CdTe Radiation Detectors Effect of High Operating Temperature on Electrcal Quantities of CdTe Radiation Detectors (en) Effect of High Operating Temperature on Electrcal Quantities of CdTe Radiation Detectors (cs)
skos:notation	RIV/00216305:26220/13:PU105406!RIV15-MSM-26220___
http://linked.open...avai/riv/aktivita	P S
http://linked.open...avai/riv/aktivity	P(ED2.1.00/03.0072), S
http://linked.open...iv/cisloPeriodika	1
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Grmela, Lubomír Trčka, Tomáš Šik, Ondřej Vondra, Marek
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	71541
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/13:PU105406
http://linked.open...riv/jazykVysledku	cze - čeština
http://linked.open.../riv/klicovaSlova	CdTe, šum, spolehlivost (en)
http://linked.open.../riv/klicoveSlovo	šum CdTe spolehlivost
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[68A789D7B679]
http://linked.open...i/riv/nazevZdroje	International Journal of Advancements in Electronics and Electrical Engineering
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Centre of sensor, information and communication systems
http://linked.open...UplatneniVysledku	2013
http://linked.open...v/svazekPeriodika	3
http://linked.open...iv/tvurceVysledku	Grmela, Lubomír Trčka, Tomáš Šik, Ondřej Vondra, Marek
issn	2319-7498
number of pages	4 (xsd:int)
http://localhost/t...ganizacniJednotka	26220

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