About: Luminescence radiation spectroscopy of silicon solar cells

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	This paper deals about results of new potential in to use one of characteristics luminescence radiation for detection defects of solar cells. So polarization spectroscopy of defect in solar cells may be used to fitting characterization of silicon solar cells. Radiation emitted by the solar cell has a wave character that can interact with the silicon structures or hypothetically thin reflectance layer of solar cells. In our research we can observed the linear partially polarization luminescence light on poly-silicon crack defect. Spectral response of using CCD camera is approximately 300 to 1100 nm. Sinusoid dependence of luminescence intensity on the angle of linear polarization analyzer rotation shown this fact. The degree of polarization depends on the material, in this case the character of defect. Polarized light can be obtained in various ways. This fact opens up for potential next new questions in this widely course of study diagnostics defects silicon solar cells. This paper deals about results of new potential in to use one of characteristics luminescence radiation for detection defects of solar cells. So polarization spectroscopy of defect in solar cells may be used to fitting characterization of silicon solar cells. Radiation emitted by the solar cell has a wave character that can interact with the silicon structures or hypothetically thin reflectance layer of solar cells. In our research we can observed the linear partially polarization luminescence light on poly-silicon crack defect. Spectral response of using CCD camera is approximately 300 to 1100 nm. Sinusoid dependence of luminescence intensity on the angle of linear polarization analyzer rotation shown this fact. The degree of polarization depends on the material, in this case the character of defect. Polarized light can be obtained in various ways. This fact opens up for potential next new questions in this widely course of study diagnostics defects silicon solar cells. (en)
Title	Luminescence radiation spectroscopy of silicon solar cells Luminescence radiation spectroscopy of silicon solar cells (en)
skos:prefLabel	Luminescence radiation spectroscopy of silicon solar cells Luminescence radiation spectroscopy of silicon solar cells (en)
skos:notation	RIV/00216305:26220/13:PU105357!RIV14-MSM-26220___
http://linked.open...avai/predkladatel	Fakulta elektrotechniky a komunikačních technologií
http://linked.open...avai/riv/aktivita	S
http://linked.open...avai/riv/aktivity	S
http://linked.open...iv/cisloPeriodika	8825
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Tománek, Pavel Frantík, Ondřej Stojan, Radek Vaněk, Jiří Gvritishvili, Roman
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	85581
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/13:PU105357
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Solar cells, photoluminescence, electroluminescence, electromagnetic radiation, polarization, defect. (en)
http://linked.open.../riv/klicoveSlovo	defect. electromagnetic radiation electroluminescence photoluminescence polarization Solar cells
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[C89158B382B9]
http://linked.open...i/riv/nazevZdroje	Proceedings of SPIE
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	6 (xsd:int)
http://linked.open...UplatneniVysledku	2013
http://linked.open...v/svazekPeriodika	8825
http://linked.open...iv/tvurceVysledku	Frantík, Ondřej Malý, Martin Stojan, Radek Tománek, Pavel Vaněk, Jiří Gvritishvili, Roman
issn	0277-786X
number of pages	6 (xsd:int)
http://bibframe.org/vocab/doi	10.1117/12.2024290
http://localhost/t...ganizacniJednotka	26220

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