About: Optical and electrical detection and localization of solar cell defects on microscale

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Monocrystalline silicon wafer is up-to-date most used material for the fabrication of solar cells. The recent investigation shows that the quality of cells is often degraded by structural defects emerging during processing steps. Hence the paper gives first an overview of solar cell efficiency investigation on macroscale. Then a detection and microscale localization of tiny local defects in solar cell structures which evidently affect electrical and photoelectrical properties of the cells is targeted. The local defects can be classified as microfractures, precipitates and other material structure inhomogeneities. Detection and localization of the defects in the structure and the assigning of particular defects to corresponding degradation of photoelectrical parameters are key points for solar cell lifetime and efficiency improvement. Although the breakdown can be evident in current-voltage plot, the localization of defects on the sample has to be provided by microscopic investigations as well as by de Monocrystalline silicon wafer is up-to-date most used material for the fabrication of solar cells. The recent investigation shows that the quality of cells is often degraded by structural defects emerging during processing steps. Hence the paper gives first an overview of solar cell efficiency investigation on macroscale. Then a detection and microscale localization of tiny local defects in solar cell structures which evidently affect electrical and photoelectrical properties of the cells is targeted. The local defects can be classified as microfractures, precipitates and other material structure inhomogeneities. Detection and localization of the defects in the structure and the assigning of particular defects to corresponding degradation of photoelectrical parameters are key points for solar cell lifetime and efficiency improvement. Although the breakdown can be evident in current-voltage plot, the localization of defects on the sample has to be provided by microscopic investigations as well as by de (en)
Title	Optical and electrical detection and localization of solar cell defects on microscale Optical and electrical detection and localization of solar cell defects on microscale (en)
skos:prefLabel	Optical and electrical detection and localization of solar cell defects on microscale Optical and electrical detection and localization of solar cell defects on microscale (en)
skos:notation	RIV/00216305:26220/13:PU105342!RIV14-GA0-26220___
http://linked.open...avai/predkladatel	Fakulta elektrotechniky a komunikačních technologií
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(ED1.1.00/02.0068), P(ED2.1.00/03.0072), P(GAP102/11/0995)
http://linked.open...iv/cisloPeriodika	8825
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Škarvada, Pavel Tománek, Pavel Grmela, Lubomír Macků, Robert Dallaeva, Dinara Prokopyeva, Elena
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	94214
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/13:PU105342
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	solar cell, silicon, monocrystalline, defect, localization, detection, efficiency (en)
http://linked.open.../riv/klicoveSlovo	defect detection efficiency silicon solar cell localization monocrystalline
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[A4ED3EF32E50]
http://linked.open...i/riv/nazevZdroje	Proceedings of SPIE
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	6 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...vavai/riv/projekt	Central european institute of technology Centre of sensor, information and communication systems Electron transport, Noise and Diagnostic of Shottky and Autoemission Cathodes
http://linked.open...UplatneniVysledku	2013
http://linked.open...v/svazekPeriodika	8825
http://linked.open...iv/tvurceVysledku	Grmela, Lubomír Macků, Robert Tománek, Pavel Škarvada, Pavel Dallaeva, Dinara Prokopyeva, Elena Smith, Steve J.
issn	0277-786X
number of pages	8 (xsd:int)
http://bibframe.org/vocab/doi	10.1117/12.2023265
http://localhost/t...ganizacniJednotka	26220

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