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  • Environmental scanning electron microscope (ESEM) is one of the latest trends in microscopic methods. In this microscope, we can observe various types of specimens, es-pecially non-conductive and wet specimens. This is given by high pressure of gas in the specimen chamber. This article deals with computational modelling of pressure conditions and shock waves generation in the scintillation detector of secondary electrons for this type of micro-scope.
  • Environmental scanning electron microscope (ESEM) is one of the latest trends in microscopic methods. In this microscope, we can observe various types of specimens, es-pecially non-conductive and wet specimens. This is given by high pressure of gas in the specimen chamber. This article deals with computational modelling of pressure conditions and shock waves generation in the scintillation detector of secondary electrons for this type of micro-scope. (en)
Title
  • Generation Of Shock Waves In Environmental Scanning Electron Microscope And Their Description
  • Generation Of Shock Waves In Environmental Scanning Electron Microscope And Their Description (en)
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  • Generation Of Shock Waves In Environmental Scanning Electron Microscope And Their Description
  • Generation Of Shock Waves In Environmental Scanning Electron Microscope And Their Description (en)
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  • RIV/00216305:26220/13:PU103481!RIV15-MSM-26220___
http://linked.open...avai/riv/aktivita
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  • P(ED0014/01/01), S
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  • 76345
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  • RIV/00216305:26220/13:PU103481
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  • Scintillation detector of secondary electrons, finite element method, upwind computational scheme, shock wave. (en)
http://linked.open.../riv/klicoveSlovo
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  • [F0CE54F998BA]
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  • Brno
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  • Brno
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  • Student EEICT Proceedings of the 19th conference
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  • Vyroubal, Petr
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  • LITERA
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  • 978-80-214-4695-3
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  • 26220
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