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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	This presentation discusses methods of technological innovation in the production of sample for dielectric spectroscopy (DS) measurement . The presentation describes in detail various types of sample production and materials used to mold the samples . Several methods are currently used for these purposes and are integrated into the manufacture process . These methods have been examined in the experiment, and the advantages and disadvantages were identifed and described in detail . The materials used in making molds for epoxy specimens with nanofllers had to meet the following characteristics : high temperature resistance, low surface friction and plasticity . Based on these properties , the following materials were used in the experiment : metal, glass, Tefon and various types of foils . At the end, the most suitable method for producing a sample for DS measurement was selected . This presentation discusses methods of technological innovation in the production of sample for dielectric spectroscopy (DS) measurement . The presentation describes in detail various types of sample production and materials used to mold the samples . Several methods are currently used for these purposes and are integrated into the manufacture process . These methods have been examined in the experiment, and the advantages and disadvantages were identifed and described in detail . The materials used in making molds for epoxy specimens with nanofllers had to meet the following characteristics : high temperature resistance, low surface friction and plasticity . Based on these properties , the following materials were used in the experiment : metal, glass, Tefon and various types of foils . At the end, the most suitable method for producing a sample for DS measurement was selected . (en)
Title	Sample preparation for dielectric spectroscopy Sample preparation for dielectric spectroscopy (en)
skos:prefLabel	Sample preparation for dielectric spectroscopy Sample preparation for dielectric spectroscopy (en)
skos:notation	RIV/00216305:26220/12:PU98505!RIV13-GA0-26220___
http://linked.open...avai/predkladatel	Fakulta elektrotechniky a komunikačních technologií
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(ED2.1.00/03.0072), P(GD102/09/H074)
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Klampár, Marián
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	166696
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/12:PU98505
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Dielectric measurements, Glass, Teflon, Metal, Template, Sample preparation (en)
http://linked.open.../riv/klicoveSlovo	Teflon Metal Glass Dielectric measurements Template Sample preparation
http://linked.open...ontrolniKodProRIV	[3B8B77482CE9]
http://linked.open...v/mistoKonaniAkce	Praha, ČVUT
http://linked.open...i/riv/mistoVydani	Czech Technical University in Prague
http://linked.open...i/riv/nazevZdroje	Proceedings of the 16th International Scientific Student Conferenece POSTER 2012
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	1 (xsd:int)
http://linked.open...vavai/riv/projekt	Centre of sensor, information and communication systems Diagnostics of material defects using the latest defectoscopic methods
http://linked.open...UplatneniVysledku	2012
http://linked.open...iv/tvurceVysledku	Klampár, Marián
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2012-05-17 (xsd:date)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Libor Husník
https://schema.org/isbn	978-80-01-05043-9
http://localhost/t...ganizacniJednotka	26220
is http://linked.open...avai/riv/vysledek of	Sample preparation for dielectric spectroscopy

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