Attributes | Values |
---|
rdf:type
| |
Description
| - The effect of ions diffusion on time dependence of noise and polarization phenomena of CdTe bulk single crystals has been carried out. We evaluated the instability of the reverse current of the Schottky contact at the P-type CdTe and the Au interface by a model which considers the effects of deep acceptors. The results shows small detrapping time compared to the experimental measurements. We suggested the diffusion of ions in depletion region at the metal - semiconductor (M-S) interface causes an additional reduction of the barrier and may be considered as another responsible mechanism for the polarization effect.
- The effect of ions diffusion on time dependence of noise and polarization phenomena of CdTe bulk single crystals has been carried out. We evaluated the instability of the reverse current of the Schottky contact at the P-type CdTe and the Au interface by a model which considers the effects of deep acceptors. The results shows small detrapping time compared to the experimental measurements. We suggested the diffusion of ions in depletion region at the metal - semiconductor (M-S) interface causes an additional reduction of the barrier and may be considered as another responsible mechanism for the polarization effect. (en)
|
Title
| - Low Frequency Noise and Ions Diffusion in the CdTe Bulk Single Crystals
- Low Frequency Noise and Ions Diffusion in the CdTe Bulk Single Crystals (en)
|
skos:prefLabel
| - Low Frequency Noise and Ions Diffusion in the CdTe Bulk Single Crystals
- Low Frequency Noise and Ions Diffusion in the CdTe Bulk Single Crystals (en)
|
skos:notation
| - RIV/00216305:26220/11:PU95379!RIV12-MSM-26220___
|
http://linked.open...avai/predkladatel
| |
http://linked.open...avai/riv/aktivita
| |
http://linked.open...avai/riv/aktivity
| - P(GAP102/11/0995), S, Z(MSM0021630503)
|
http://linked.open...vai/riv/dodaniDat
| |
http://linked.open...aciTvurceVysledku
| |
http://linked.open.../riv/druhVysledku
| |
http://linked.open...iv/duvernostUdaju
| |
http://linked.open...titaPredkladatele
| |
http://linked.open...dnocenehoVysledku
| |
http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26220/11:PU95379
|
http://linked.open...riv/jazykVysledku
| |
http://linked.open.../riv/klicovaSlova
| - Noise, CdTe, Metal- Semiconductor interface, Ion diffusion (en)
|
http://linked.open.../riv/klicoveSlovo
| |
http://linked.open...ontrolniKodProRIV
| |
http://linked.open...v/mistoKonaniAkce
| |
http://linked.open...i/riv/mistoVydani
| |
http://linked.open...i/riv/nazevZdroje
| - 21st International Conference on Noise and Fluctuations
|
http://linked.open...in/vavai/riv/obor
| |
http://linked.open...ichTvurcuVysledku
| |
http://linked.open...cetTvurcuVysledku
| |
http://linked.open...vavai/riv/projekt
| |
http://linked.open...UplatneniVysledku
| |
http://linked.open...iv/tvurceVysledku
| - Grmela, Lubomír
- Šikula, Josef
- Šik, Ondřej
- Elhadidy, Hassan Ali Mohamed
- Zajaček, Jiří
|
http://linked.open...vavai/riv/typAkce
| |
http://linked.open.../riv/zahajeniAkce
| |
http://linked.open...n/vavai/riv/zamer
| |
number of pages
| |
http://purl.org/ne...btex#hasPublisher
| |
https://schema.org/isbn
| |
http://localhost/t...ganizacniJednotka
| |
is http://linked.open...avai/riv/vysledek
of | |