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  • The paper deals with possibilities of power IGBT transistor diagnostics directly in driver of voltage source inverters. It is necessary to implement the diagnostics circuits as close as possible to the power IGBT transistor due to high demands on drive reliability and failure predictability in many applications. Possibilities of diagnostics quantities measurements are discussed in the paper. The measurements of transistor chip temperature, voltage overshoot size, off-state voltage, on-state saturation voltage, measurement of inverter output current, gate charge measurement and driver secondary side supply voltages are discussed. Possibilities of IGBT diagnosis and IGBT technical state based on measured data are also discussed. The paper also proposes some hardware solutions for obtaining mentioned information and methods of using measured data in IGBT downgrading progress monitoring, failure prediction and drive maintenance planning.
  • The paper deals with possibilities of power IGBT transistor diagnostics directly in driver of voltage source inverters. It is necessary to implement the diagnostics circuits as close as possible to the power IGBT transistor due to high demands on drive reliability and failure predictability in many applications. Possibilities of diagnostics quantities measurements are discussed in the paper. The measurements of transistor chip temperature, voltage overshoot size, off-state voltage, on-state saturation voltage, measurement of inverter output current, gate charge measurement and driver secondary side supply voltages are discussed. Possibilities of IGBT diagnosis and IGBT technical state based on measured data are also discussed. The paper also proposes some hardware solutions for obtaining mentioned information and methods of using measured data in IGBT downgrading progress monitoring, failure prediction and drive maintenance planning. (en)
Title
  • Implementation of diagnostics functions in the IGBT drivers, part 1. Diagnostics
  • Implementation of diagnostics functions in the IGBT drivers, part 1. Diagnostics (en)
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  • Implementation of diagnostics functions in the IGBT drivers, part 1. Diagnostics
  • Implementation of diagnostics functions in the IGBT drivers, part 1. Diagnostics (en)
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  • RIV/00216305:26220/11:PU93486!RIV12-MSM-26220___
http://linked.open...avai/predkladatel
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(ED0014/01/01), P(EE2.3.09.0162), S, Z(MSM0021630516)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 203816
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/11:PU93486
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • diagnostics, IGBT driver, power transistor (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [E4BD8F42BED6]
http://linked.open...v/mistoKonaniAkce
  • Bologna
http://linked.open...i/riv/mistoVydani
  • Bologna, IT
http://linked.open...i/riv/nazevZdroje
  • Proceedings of the 8th IEEE Symposium on Diagnostics for Electrical Machines, Power Electronics & Drives
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Klíma, Bohumil
  • Knobloch, Jan
  • Pochyla, Martin
  • Nouman, Ziad
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • Neuveden
https://schema.org/isbn
  • 978-1-4244-9302-9
http://localhost/t...ganizacniJednotka
  • 26220
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