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  • PN junction is one of the most important parts of solar cells. Its quality affects lifetime and efficiency of solar cells. Local defects which appear in PN junctions during the manufacture process are very important from this point of view. Measuring method of narrow-band noise current RMS value with reverse bias junction were used in this paper. This method allows detection of local defects and volume degradation in PN junctions of solar cells and it can be used for detection of microplasma noise.
  • PN junction is one of the most important parts of solar cells. Its quality affects lifetime and efficiency of solar cells. Local defects which appear in PN junctions during the manufacture process are very important from this point of view. Measuring method of narrow-band noise current RMS value with reverse bias junction were used in this paper. This method allows detection of local defects and volume degradation in PN junctions of solar cells and it can be used for detection of microplasma noise. (en)
Title
  • Noise diagnostics of solar cells
  • Noise diagnostics of solar cells (en)
skos:prefLabel
  • Noise diagnostics of solar cells
  • Noise diagnostics of solar cells (en)
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  • RIV/00216305:26220/11:PU93358!RIV12-MSM-26220___
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  • P(GAP102/10/2013), Z(MSM0021630503)
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  • 216135
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  • RIV/00216305:26220/11:PU93358
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  • solar cell, microplasma noise, reverse voltage, PN junction (en)
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  • [CAB93D3F772D]
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  • Brno
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  • Brno
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  • Proceedings of the 17th conference STUDENT EEICT 2010 volume 3
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  • Paračka, Petr
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number of pages
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  • Vysoké učení technické v Brně
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  • 978-80-214-4273-3
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  • 26220
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