About: Photoluminescence scanner of the solar cell

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	This paper presents an innovated method for material diagnostic using the photoluminescence induced by focused laser beam (mapping) and detected by photomultiplier tube amplifier. The common photoluminescence method is used for detecting material defects in substrate quite often. It requires a first-rate camera with CCD chip and high power monochromatic source of light and high quality filters separating the luminescence light and the source light. Our new method with photomultiplier tube amplifier is able to detect photons emitted by tested material which are not able to be detected by common even more high-rate CCD chip camera and for this reason we can analyze more specific defects in silicon structure than common photoluminescence equipment. This paper presents an innovated method for material diagnostic using the photoluminescence induced by focused laser beam (mapping) and detected by photomultiplier tube amplifier. The common photoluminescence method is used for detecting material defects in substrate quite often. It requires a first-rate camera with CCD chip and high power monochromatic source of light and high quality filters separating the luminescence light and the source light. Our new method with photomultiplier tube amplifier is able to detect photons emitted by tested material which are not able to be detected by common even more high-rate CCD chip camera and for this reason we can analyze more specific defects in silicon structure than common photoluminescence equipment. (en)
Title	Photoluminescence scanner of the solar cell Photoluminescence scanner of the solar cell (en)
skos:prefLabel	Photoluminescence scanner of the solar cell Photoluminescence scanner of the solar cell (en)
skos:notation	RIV/00216305:26220/10:PU90088!RIV11-GA0-26220___
http://linked.open...avai/riv/aktivita	P S
http://linked.open...avai/riv/aktivity	P(GA102/09/0859), S
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Bařinka, Radim Veselý, Aleš Vaněk, Jiří Solčanský, Marek
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	278842
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/10:PU90088
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Photoluminescence, Scanning, Defects, Solar Cells (en)
http://linked.open.../riv/klicoveSlovo	Defects Photoluminescence Scanning Solar Cells
http://linked.open...ontrolniKodProRIV	[78211407826E]
http://linked.open...v/mistoKonaniAkce	Valencia
http://linked.open...i/riv/mistoVydani	Valencie
http://linked.open...i/riv/nazevZdroje	Proceedings of 25th European Photovoltaic Solar Energy Conference and Exhibition
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Local Light Emission in Association with Stochastic Processes in PN Junction in Solar Cells at Cryo Temperature.
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Bařinka, Radim Solčanský, Marek Vaněk, Jiří Veselý, Aleš
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2010-09-06 (xsd:date)
number of pages	3 (xsd:int)
http://purl.org/ne...btex#hasPublisher	WIP
https://schema.org/isbn	3-936338-26-4
http://localhost/t...ganizacniJednotka	26220
is http://linked.open...avai/riv/vysledek of	Photoluminescence scanner of the solar cell

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