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  • Presented paper deals with noise diagnostics of defects in monocrystalline silicon solar cells PN junctions. Localized regions featuring increased concentration of donor or acceptor impurities, other element admixtures or other defects which cause the PN junction reverse breakdown voltage to be reduced. When a high electric field is applied to this PN junction, local breakdowns arise in micro-sized regions, which in turn can lead to the deterioration in quality or destruction of the PN junction. The useful tool for diagnostics of local defects in PN junctions is the reverse-biased PN junction narrow-band RMS noise current vs. reverse voltage measuring. The set of crystalline silicon solar cells with different structure was studied by this noise diagnostic method.
  • Presented paper deals with noise diagnostics of defects in monocrystalline silicon solar cells PN junctions. Localized regions featuring increased concentration of donor or acceptor impurities, other element admixtures or other defects which cause the PN junction reverse breakdown voltage to be reduced. When a high electric field is applied to this PN junction, local breakdowns arise in micro-sized regions, which in turn can lead to the deterioration in quality or destruction of the PN junction. The useful tool for diagnostics of local defects in PN junctions is the reverse-biased PN junction narrow-band RMS noise current vs. reverse voltage measuring. The set of crystalline silicon solar cells with different structure was studied by this noise diagnostic method. (en)
Title
  • Narrow-band noise as a tool for diagnostics of solar cells pn junctions
  • Narrow-band noise as a tool for diagnostics of solar cells pn junctions (en)
skos:prefLabel
  • Narrow-band noise as a tool for diagnostics of solar cells pn junctions
  • Narrow-band noise as a tool for diagnostics of solar cells pn junctions (en)
skos:notation
  • RIV/00216305:26220/10:PU89295!RIV11-GA0-26220___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GAP102/10/2013), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 273717
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/10:PU89295
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Solar cell, noise diagnostics, PN junction, local defects, microplasma, avalanche breakdown (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [3DDFBEA32D49]
http://linked.open...v/mistoKonaniAkce
  • Praha
http://linked.open...i/riv/mistoVydani
  • Wroclaw
http://linked.open...i/riv/nazevZdroje
  • 2010 9th International Conference on Environment end Electrical engineerong
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Bařinka, Radim
  • Koktavý, Pavel
  • Macků, Robert
  • Paračka, Petr
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • Reprotechnika Wroclaw
https://schema.org/isbn
  • 978-1-4244-5374-0
http://localhost/t...ganizacniJednotka
  • 26220
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