About: Power efficiency of tapered probe and its influence on resolution in Scanning near-field optical microscopy

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About: Power efficiency of tapered probe and its influence on resolution in Scanning near-field optical microscopy Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Novel optical techniques such as near-field come in a study of local properties of transparent or opaque microscopic structures such as optical waveguides, optoelectronic integrated circuits, photonic crystals, semiconductor interfaces, nanostructured systems. To control a light-matter interaction at nanometer distance, structures guiding electromagnetic energy with lateral mode confinement below the diffraction limit of light are necessary. Tapered optical fiber probe is a crucial part of the system, governs its resolution, and simultaneously could play role as light source and/or detector. The paper brings a simulation of losses, taking into account its correctly described geometry, as well as experimental verification of resolution obtained with this probe. Novel optical techniques such as near-field come in a study of local properties of transparent or opaque microscopic structures such as optical waveguides, optoelectronic integrated circuits, photonic crystals, semiconductor interfaces, nanostructured systems. To control a light-matter interaction at nanometer distance, structures guiding electromagnetic energy with lateral mode confinement below the diffraction limit of light are necessary. Tapered optical fiber probe is a crucial part of the system, governs its resolution, and simultaneously could play role as light source and/or detector. The paper brings a simulation of losses, taking into account its correctly described geometry, as well as experimental verification of resolution obtained with this probe. (en)
Title	Power efficiency of tapered probe and its influence on resolution in Scanning near-field optical microscopy Power efficiency of tapered probe and its influence on resolution in Scanning near-field optical microscopy (en)
skos:prefLabel	Power efficiency of tapered probe and its influence on resolution in Scanning near-field optical microscopy Power efficiency of tapered probe and its influence on resolution in Scanning near-field optical microscopy (en)
skos:notation	RIV/00216305:26220/10:PU88022!RIV11-GA0-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/08/1474), Z(MSM0021630503)
http://linked.open...iv/cisloPeriodika	3
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Škarvada, Pavel Tománek, Pavel
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	280615
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/10:PU88022
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	light-matter interaction, near field, optics, taper, radiation, loss, efficiency, resolution (en)
http://linked.open.../riv/klicoveSlovo	loss optics efficiency radiation near field resolution light-matter interaction taper
http://linked.open...odStatuVydavatele	SK - Slovenská republika
http://linked.open...ontrolniKodProRIV	[D49ACEBC7BF9]
http://linked.open...i/riv/nazevZdroje	Acta Electrotechnica et Informatica
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Local optical and electronic characterisation of optoelectronic structures with nanometric resolution
http://linked.open...UplatneniVysledku	2010
http://linked.open...v/svazekPeriodika	10
http://linked.open...iv/tvurceVysledku	Tománek, Pavel Škarvada, Pavel
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
issn	1335-8243
number of pages	5 (xsd:int)
http://localhost/t...ganizacniJednotka	26220
is http://linked.open...avai/riv/vysledek of	Power efficiency of tapered probe and its influence on resolution in Scanning near-field optical microscopy

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