About: Detection and localization of defects in monocrystalline silicon solar cell

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Near-surface defects in solar cell wafer have undesirable influence upon device properties, as its efficiency and lifetime. When reverse-bias voltage is applied to the wafer, a magnitude of electric signals from defects can be measured electronically, but the localization of defects is difficult using classical optical far-field methods. Therefore, the paper introduces a novel combination of electric and optical methods showing promise of being useful in detection and localization of defects with resolution of 250nm using near-field nondestructive characterization techniques. The results of mapped topography, local surface reflection, and local light to electric energy conversion measurement in areas with small defects strongly support the development and further evaluation of the technique. Near-surface defects in solar cell wafer have undesirable influence upon device properties, as its efficiency and lifetime. When reverse-bias voltage is applied to the wafer, a magnitude of electric signals from defects can be measured electronically, but the localization of defects is difficult using classical optical far-field methods. Therefore, the paper introduces a novel combination of electric and optical methods showing promise of being useful in detection and localization of defects with resolution of 250nm using near-field nondestructive characterization techniques. The results of mapped topography, local surface reflection, and local light to electric energy conversion measurement in areas with small defects strongly support the development and further evaluation of the technique. (en)
Title	Detection and localization of defects in monocrystalline silicon solar cell Detection and localization of defects in monocrystalline silicon solar cell (en)
skos:prefLabel	Detection and localization of defects in monocrystalline silicon solar cell Detection and localization of defects in monocrystalline silicon solar cell (en)
skos:notation	RIV/00216305:26220/10:PU83905!RIV11-GA0-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/08/1474), Z(MSM0021630503)
http://linked.open...iv/cisloPeriodika	805325
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Škarvada, Pavel Tománek, Pavel Grmela, Lubomír Macků, Robert
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	253628
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/10:PU83905
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Defect, optoelectronic device, solar cells, near-field (en)
http://linked.open.../riv/klicoveSlovo	solar cells Defect near-field optoelectronic device
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[105A6C1DC582]
http://linked.open...i/riv/nazevZdroje	Advances in Optical Technologies
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Local optical and electronic characterisation of optoelectronic structures with nanometric resolution
http://linked.open...UplatneniVysledku	2010
http://linked.open...v/svazekPeriodika	2010
http://linked.open...iv/tvurceVysledku	Grmela, Lubomír Macků, Robert Tománek, Pavel Škarvada, Pavel
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
issn	1687-6393
number of pages	5 (xsd:int)
http://localhost/t...ganizacniJednotka	26220
is http://linked.open...avai/riv/vysledek of	Detection and localization of defects in monocrystalline silicon solar cell

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