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  • Paper presents a numerical analysis of quantum states and probability function of a Si nanostructure in a dielectric medium under varying bias. The position of probability function peak xp is traced and the bias, under which it abandons the structure (emission or discharging bias), is determined. Variations of the ground state energy with the bias is also examined. The Poisson and Schrödinger 1D models of COMSOL Multiphysics program are employed. The results would help understanding the electronic properties and behavior of ultrascaled memory devices utilizing semiconducting quantum dots and single nanocrystals, to mention only one application.
  • Paper presents a numerical analysis of quantum states and probability function of a Si nanostructure in a dielectric medium under varying bias. The position of probability function peak xp is traced and the bias, under which it abandons the structure (emission or discharging bias), is determined. Variations of the ground state energy with the bias is also examined. The Poisson and Schrödinger 1D models of COMSOL Multiphysics program are employed. The results would help understanding the electronic properties and behavior of ultrascaled memory devices utilizing semiconducting quantum dots and single nanocrystals, to mention only one application. (en)
Title
  • Behaviour of silicon nanostructure in electric field
  • Behaviour of silicon nanostructure in electric field (en)
skos:prefLabel
  • Behaviour of silicon nanostructure in electric field
  • Behaviour of silicon nanostructure in electric field (en)
skos:notation
  • RIV/00216305:26220/09:PU84759!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/07/0113), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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  • 304823
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  • RIV/00216305:26220/09:PU84759
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  • nanostructure, quantum dot, discharging bias, Poisson-Schrödinger numerical analysis, Comsol multiphysics (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [A6973F7D88EB]
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  • Košice
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  • Košice, SK
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  • Proceedings of Physics of Materials 09, V. Lisý, D. Olčák (Eds).,
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http://linked.open...UplatneniVysledku
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  • Grmela, Lubomír
  • Hruška, Pavel
http://linked.open...vavai/riv/typAkce
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number of pages
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  • Faculty of Electrical Engineering and Informatics, Technical University of Košice,
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  • 978-80-8086-122-3
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  • 26220
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