About: Bulk Resistance Decay in CdTe

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Description	Bulk resistance decay of cadmium telluride (CdTe) single crystals was investigated. The bulk resistance of each CdTe single crystal was measured during long time interval. The samples were placed into a cryostat. That allowed us to hold the temperature constant during the measurements and eliminate the illumination influence. The measurements started and were continued at 300 K and after some period of time it was sharply raised up to 390 K. We observed the resistance slow decreasing with time with temperature T = 300 K and T = 390 K. All the samples have very high value of relaxation time. The presented samples must have not one but four acceptor or donor levels, some of them are deep levels. We have discovered that the interactions between the valence band and deep acceptor levels or between the conductivity band and deep donor levels cause this long value of relaxation time. Bulk resistance decay of cadmium telluride (CdTe) single crystals was investigated. The bulk resistance of each CdTe single crystal was measured during long time interval. The samples were placed into a cryostat. That allowed us to hold the temperature constant during the measurements and eliminate the illumination influence. The measurements started and were continued at 300 K and after some period of time it was sharply raised up to 390 K. We observed the resistance slow decreasing with time with temperature T = 300 K and T = 390 K. All the samples have very high value of relaxation time. The presented samples must have not one but four acceptor or donor levels, some of them are deep levels. We have discovered that the interactions between the valence band and deep acceptor levels or between the conductivity band and deep donor levels cause this long value of relaxation time. (en)
Title	Bulk Resistance Decay in CdTe Bulk Resistance Decay in CdTe (en)
skos:prefLabel	Bulk Resistance Decay in CdTe Bulk Resistance Decay in CdTe (en)
skos:notation	RIV/00216305:26220/09:PU82501!RIV10-GA0-26220___
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(GA102/07/0113)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Grmela, Lubomír Šikula, Josef Chvátal, Miloš Raška, Michal Andreev, Alexey
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	305640
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/09:PU82501
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	CdTe single crystal, relaxation process, deep level defects (en)
http://linked.open.../riv/klicoveSlovo	CdTe single crystal deep level defects relaxation process
http://linked.open...ontrolniKodProRIV	[315476EFDA85]
http://linked.open...v/mistoKonaniAkce	Saint-Petersburg
http://linked.open...i/riv/mistoVydani	St. Petersburg, Russia
http://linked.open...i/riv/nazevZdroje	IEEE EUROCON 2009
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Noise as Diagnostic Tool for Schottky and Could Electron Emission Cathodes
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Grmela, Lubomír Šikula, Josef Andreev, Alexey Chvátal, Miloš Raška, Michal
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2009-05-18 (xsd:date)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Institute of Electrical and Electronics Engineers, St. Petersburg
https://schema.org/isbn	978-1-4244-3861-7
http://localhost/t...ganizacniJednotka	26220
is http://linked.open...avai/riv/vysledek of	Bulk Resistance Decay in CdTe Bulk Resistance Decay in CdTe Bulk Resistance Decay in CdTe Bulk Resistance Decay in CdTe

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