About: Near-field photoelectric measurement of Si solar cells

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	This paper treats of nondestructive local silicon solar cell sample measurement and characterization. Used method, harnessing scanning near field optical microscope in reflection regime with keying laser excitation, allows a localization and characterization of structure imperfections. Keyingless and keying optical excitation measurement methods are discussed. Low energy optical excitation permits measurement only in small range of I-V characteristics, where the shunt resistance is dominant. Described method has been adapted for the simultaneous measurement of sample surface topography, its optical properties as well as sample local photoelectric properties. Structure imperfections taking effect on current voltage characteristics were observed and its size, photoelectric and electric properties were measured. Although the relationships of local imperfection with electric measurement were ascertained, their confirmation will be a subject of ongoing work. This paper treats of nondestructive local silicon solar cell sample measurement and characterization. Used method, harnessing scanning near field optical microscope in reflection regime with keying laser excitation, allows a localization and characterization of structure imperfections. Keyingless and keying optical excitation measurement methods are discussed. Low energy optical excitation permits measurement only in small range of I-V characteristics, where the shunt resistance is dominant. Described method has been adapted for the simultaneous measurement of sample surface topography, its optical properties as well as sample local photoelectric properties. Structure imperfections taking effect on current voltage characteristics were observed and its size, photoelectric and electric properties were measured. Although the relationships of local imperfection with electric measurement were ascertained, their confirmation will be a subject of ongoing work. (en)
Title	Near-field photoelectric measurement of Si solar cells Near-field photoelectric measurement of Si solar cells (en)
skos:prefLabel	Near-field photoelectric measurement of Si solar cells Near-field photoelectric measurement of Si solar cells (en)
skos:notation	RIV/00216305:26220/09:PU82379!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/08/1474), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Škarvada, Pavel Tománek, Pavel Macků, Robert
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	328808
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/09:PU82379
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Scanning Near-field Optical Microscope, Silicon Solar Cell, Photoelectric Properties (en)
http://linked.open.../riv/klicoveSlovo	Scanning Near-field Optical Microscope Silicon Solar Cell Photoelectric Properties
http://linked.open...ontrolniKodProRIV	[C7D3D57EFB97]
http://linked.open...v/mistoKonaniAkce	Hamburg
http://linked.open...i/riv/mistoVydani	Hamburg, Germany
http://linked.open...i/riv/nazevZdroje	24th European Photovoltaic Solar Energy Conference Proceedings
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Local optical and electronic characterisation of optoelectronic structures with nanometric resolution
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Macků, Robert Tománek, Pavel Škarvada, Pavel
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2009-09-20 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Neuveden
https://schema.org/isbn	3-936338-25-6
http://localhost/t...ganizacniJednotka	26220
is http://linked.open...avai/riv/vysledek of	Near-field photoelectric measurement of Si solar cells Near-field photoelectric measurement of Si solar cells Near-field photoelectric measurement of Si solar cells Near-field photoelectric measurement of Si solar cells

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