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  • We have tested the sample of MOSFET by electro-ultrasonic spectroscopy. Electro-ultrasonic spectroscopy is non-destructive testing method. This method is based on interaction of two signals. Electrical signal of frequency fE and ultrasonic signal of frequency fU. The ultrasonic signal induces the resistance change in the sample structure. Defects and un-homogeneities are the sources of new signal on frequency which is given by superposition or subtraction of exciting frequencies fE and fU. We suppose that the ultrasonic wave have some influence on the particle mobility. We have tested the sample of MOSFET IRF 510. We have analyzed signal on frequency of ultrasonic excitation fU for different amplitudes on DC drain voltage and gate voltage. In this paper you can see some results which consequent from our measurements
  • We have tested the sample of MOSFET by electro-ultrasonic spectroscopy. Electro-ultrasonic spectroscopy is non-destructive testing method. This method is based on interaction of two signals. Electrical signal of frequency fE and ultrasonic signal of frequency fU. The ultrasonic signal induces the resistance change in the sample structure. Defects and un-homogeneities are the sources of new signal on frequency which is given by superposition or subtraction of exciting frequencies fE and fU. We suppose that the ultrasonic wave have some influence on the particle mobility. We have tested the sample of MOSFET IRF 510. We have analyzed signal on frequency of ultrasonic excitation fU for different amplitudes on DC drain voltage and gate voltage. In this paper you can see some results which consequent from our measurements (en)
Title
  • ELECTRO-ULTRASONIC SPECTROSCOPY OF MOSFETS
  • ELECTRO-ULTRASONIC SPECTROSCOPY OF MOSFETS (en)
skos:prefLabel
  • ELECTRO-ULTRASONIC SPECTROSCOPY OF MOSFETS
  • ELECTRO-ULTRASONIC SPECTROSCOPY OF MOSFETS (en)
skos:notation
  • RIV/00216305:26220/09:PU81551!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA106/07/1393), P(GD102/09/H074), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 312919
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/09:PU81551
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • electro-ultrasonic, spectroscopy, non-destructive testing, MOSFET, particle mobility (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [99B016CE4283]
http://linked.open...v/mistoKonaniAkce
  • Králíky
http://linked.open...i/riv/mistoVydani
  • Neuveden
http://linked.open...i/riv/nazevZdroje
  • IEEE Workshop Králíky 2009
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Tofel, Pavel
  • Šikula, Josef
  • Paračka, Petr
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • Neuveden
https://schema.org/isbn
  • 978-80-214-3938-2
http://localhost/t...ganizacniJednotka
  • 26220
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