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  • We have studied the properties of polymer-based thick film layers by electro-ultrasonic spectroscopy. Electro-ultrasonic spectroscopy method is based on the interaction between ultrasonic vibrations and electrical conductivity of solids. The ultrasonic vibrations of frequency fU change the contact area between conducting grains in the thick film structure and then the resistance is modulated by the frequency of ultrasonic excitation. An intermodulation voltage is created on this structure. It depends on the value of AC current varying with frequency fE and on the ultrasonic excited resistance change dR varying with frequency fU. We have measured the intermodulation voltage Um for a set of polymer-based thick film resistors made by different resistive pastes. It was found that for given sample the intermodulation component of frequency fm = fE - fU increases linearly with electric excitation for the constant ultrasonic excitation. We have normalized the intermodulation voltage Um by the electric curren
  • We have studied the properties of polymer-based thick film layers by electro-ultrasonic spectroscopy. Electro-ultrasonic spectroscopy method is based on the interaction between ultrasonic vibrations and electrical conductivity of solids. The ultrasonic vibrations of frequency fU change the contact area between conducting grains in the thick film structure and then the resistance is modulated by the frequency of ultrasonic excitation. An intermodulation voltage is created on this structure. It depends on the value of AC current varying with frequency fE and on the ultrasonic excited resistance change dR varying with frequency fU. We have measured the intermodulation voltage Um for a set of polymer-based thick film resistors made by different resistive pastes. It was found that for given sample the intermodulation component of frequency fm = fE - fU increases linearly with electric excitation for the constant ultrasonic excitation. We have normalized the intermodulation voltage Um by the electric curren (en)
Title
  • Electro-ultrasonic spectroscopy of polymer-based thick film layers
  • Electro-ultrasonic spectroscopy of polymer-based thick film layers (en)
skos:prefLabel
  • Electro-ultrasonic spectroscopy of polymer-based thick film layers
  • Electro-ultrasonic spectroscopy of polymer-based thick film layers (en)
skos:notation
  • RIV/00216305:26220/08:PU74828!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/06/0866), P(GP102/07/P482), Z(MSM0021630503)
http://linked.open...iv/cisloPeriodika
  • 6
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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http://linked.open...dnocenehoVysledku
  • 365883
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/08:PU74828
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Electro-Ultrasonic Spectroscopy, Non-destructive Testing, Thick Film, Polymer (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [97ABBCF59617]
http://linked.open...i/riv/nazevZdroje
  • Microelectronics Reliability
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 48
http://linked.open...iv/tvurceVysledku
  • Majzner, Jiří
  • Sedláková, Vlasta
  • Tofel, Pavel
  • Šikula, Josef
http://linked.open...n/vavai/riv/zamer
issn
  • 0026-2714
number of pages
http://localhost/t...ganizacniJednotka
  • 26220
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