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  • We have carried out noise measurements of CdTe single crystals, prepared by Institute of Physics, Charles University in Prague. These crystals are used as radiation detectors. Three types of significant noise were observed: low frequency noise, generation-recombination noise and thermal noise. The sample had very high value of 1/f noise, much higher than theoretical estimation. The depleted layers nearby the contacts are the dominating sources of noise. The contact whereof the hole concentration reduces with an applied electric field exerts prevailing effect on the noise. The resulting noise voltage is much higher than it must have been with the calculated quantity of charge carriers in the sample as a result of the depleted layers effect on the noise. Consequently the significant noise voltage appeared in the area nearby the contacts sums with the much lower value of the noise voltage in the homogenous area of the sample
  • We have carried out noise measurements of CdTe single crystals, prepared by Institute of Physics, Charles University in Prague. These crystals are used as radiation detectors. Three types of significant noise were observed: low frequency noise, generation-recombination noise and thermal noise. The sample had very high value of 1/f noise, much higher than theoretical estimation. The depleted layers nearby the contacts are the dominating sources of noise. The contact whereof the hole concentration reduces with an applied electric field exerts prevailing effect on the noise. The resulting noise voltage is much higher than it must have been with the calculated quantity of charge carriers in the sample as a result of the depleted layers effect on the noise. Consequently the significant noise voltage appeared in the area nearby the contacts sums with the much lower value of the noise voltage in the homogenous area of the sample (en)
Title
  • Noise Sources of p-type CdTe Single Crystal
  • Noise Sources of p-type CdTe Single Crystal (en)
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  • Noise Sources of p-type CdTe Single Crystal
  • Noise Sources of p-type CdTe Single Crystal (en)
skos:notation
  • RIV/00216305:26220/08:PU74426!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/07/0113), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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  • 382833
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/08:PU74426
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • spectral noise density, noise spectroscopy, CdTe single crystal (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [9CE85E1CC74B]
http://linked.open...v/mistoKonaniAkce
  • Budapest
http://linked.open...i/riv/mistoVydani
  • Budapest, Hungary
http://linked.open...i/riv/nazevZdroje
  • ISSE 2008 Reliability and Life-time Prediction
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Grmela, Lubomír
  • Šikula, Josef
  • Andreev, Alexey
  • Raška, Michal
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
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  • Zsolt Illyefalvi-Vitez
https://schema.org/isbn
  • 978-963-06-4915-5
http://localhost/t...ganizacniJednotka
  • 26220
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