About: Scanning near-field optical microscopy     Goto   Sponge   NotDistinct   Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

AttributesValues
rdf:type
Description
  • Rastrovací optický mikroskop s lokální sondou má oproti jiným technikám některé výhodné vlastnosti. Mezi hlavní výhody patří jednoduché použití, minimální příprava vzorku a možnost získat dodatečnou informaci o vzorku. Rozlišujeme dva základní typy reflexní a transmisní. K měření topografie je použit systém s ladící vidličkou založený na laterálních smykových silách mezi hrotem a vzorkem. Mikroskop pracuje v módu konstantního proudu, to znamená, že v každém okamžiku je vzdálenost mezi hrotem a povrchem vzorku konstantní. Jako sondy se používají zašpičatělá optická vlákna s kovovým opláštěním. Dodatečná informace během skenování může být v případě reflexního uspořádání mikroskopu lokální odrazivost vzorku. Takto získané informace umožňují blíže zkoumat vzorek. (cs)
  • Optical microscopy with local probe in the near field has several advantages against other microscopy types. Main advantages are: easy use, minimal preparation of sample and possibility to get some extra information about sample. There are two basic modes: reflection mode and transmission mode. For sample surface topography measuring fiber quartz system based on shear forces between the tip and sample is used. Topography of sample is important because it allows to keep the distance between the tip and the sample surface constant and this is necessary for increasing the signal to noise ratio. As a probe is being used a metal coated optical fiber taper. During the scanning it is possible to get some extra information. In the case of reflection mode microscope configuration it is local reflection of sample. This characteristic of sample allows specifying some defects of the structure.
  • Optical microscopy with local probe in the near field has several advantages against other microscopy types. Main advantages are: easy use, minimal preparation of sample and possibility to get some extra information about sample. There are two basic modes: reflection mode and transmission mode. For sample surface topography measuring fiber quartz system based on shear forces between the tip and sample is used. Topography of sample is important because it allows to keep the distance between the tip and the sample surface constant and this is necessary for increasing the signal to noise ratio. As a probe is being used a metal coated optical fiber taper. During the scanning it is possible to get some extra information. In the case of reflection mode microscope configuration it is local reflection of sample. This characteristic of sample allows specifying some defects of the structure. (en)
Title
  • Scanning near-field optical microscopy
  • Rastrovací optický mikroskop s lokální sondou (cs)
  • Scanning near-field optical microscopy (en)
skos:prefLabel
  • Scanning near-field optical microscopy
  • Rastrovací optický mikroskop s lokální sondou (cs)
  • Scanning near-field optical microscopy (en)
skos:notation
  • RIV/00216305:26220/07:PU70090!RIV08-GA0-26220___
http://linked.open.../vavai/riv/strany
  • 274-277
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/07/0113), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 448960
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/07:PU70090
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Near-field optical microscopy, SNOM, Shear forces, Topography, Reflectivity (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [58C54106DE89]
http://linked.open...v/mistoKonaniAkce
  • Brno
http://linked.open...i/riv/mistoVydani
  • Brno
http://linked.open...i/riv/nazevZdroje
  • New Trends in Physics
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Škarvada, Pavel
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • Ing. Zdeněk Novotný CSc.
https://schema.org/isbn
  • 978-80-7355-078-3
http://localhost/t...ganizacniJednotka
  • 26220
is http://linked.open...avai/riv/vysledek of
Faceted Search & Find service v1.16.118 as of Jun 21 2024


Alternative Linked Data Documents: ODE     Content Formats:   [cxml] [csv]     RDF   [text] [turtle] [ld+json] [rdf+json] [rdf+xml]     ODATA   [atom+xml] [odata+json]     Microdata   [microdata+json] [html]    About   
This material is Open Knowledge   W3C Semantic Web Technology [RDF Data] Valid XHTML + RDFa
OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 58 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software