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| rdf:type
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| Description
| - The current progress in semiconductor optoelectronics, laser diodes, fast photodetectors, optical modulators, MEMS and MOEMS technology, micro- and nano-electronics development and optical manufacturing technology opens new and improved perspectives for optical sensors and measuring systems, which integrate several components in order to achieve new functionalities. To measure local characteristics of these devices, the use of near-field optics is very important because the coupling of the evanescent ellectromagnetic field and the radiative electromagnetic waves in the vicinity of a nano-probe placed near the boundary between allows overcome the diffraction limit of light of conventional optics. This technique could be useful to the measurement and sensing of local optical and electro-optical characteristics in nanoscience. The paper brings an overview of several methods using the contrast mechanisms in optical near-field to characterize nanophotonic devices.
- The current progress in semiconductor optoelectronics, laser diodes, fast photodetectors, optical modulators, MEMS and MOEMS technology, micro- and nano-electronics development and optical manufacturing technology opens new and improved perspectives for optical sensors and measuring systems, which integrate several components in order to achieve new functionalities. To measure local characteristics of these devices, the use of near-field optics is very important because the coupling of the evanescent ellectromagnetic field and the radiative electromagnetic waves in the vicinity of a nano-probe placed near the boundary between allows overcome the diffraction limit of light of conventional optics. This technique could be useful to the measurement and sensing of local optical and electro-optical characteristics in nanoscience. The paper brings an overview of several methods using the contrast mechanisms in optical near-field to characterize nanophotonic devices. (en)
- The current progress in semiconductor optoelectronics, laser diodes, fast photodetectors, optical modulators, MEMS and MOEMS technology, micro- and nano-electronics development and optical manufacturing technology opens new and improved perspectives for optical sensors and measuring systems, which integrate several components in order to achieve new functionalities. To measure local characteristics of these devices, the use of near-field optics is very important because the coupling of the evanescent ellectromagnetic field and the radiative electromagnetic waves in the vicinity of a nano-probe placed near the boundary between allows overcome the diffraction limit of light of conventional optics. This technique could be useful to the measurement and sensing of local optical and electro-optical characteristics in nanoscience. The paper brings an overview of several methods using the contrast mechanisms in optical near-field to characterize nanophotonic devices. (cs)
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| Title
| - Near-field optical measurement and sensing in Nanophotonics
- Near-field optical measurement and sensing in Nanophotonics (en)
- Využití metod optického blízkého pole pro měření a senzory v nanofotonice (cs)
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| skos:prefLabel
| - Near-field optical measurement and sensing in Nanophotonics
- Near-field optical measurement and sensing in Nanophotonics (en)
- Využití metod optického blízkého pole pro měření a senzory v nanofotonice (cs)
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| skos:notation
| - RIV/00216305:26220/06:PU62150!RIV06-MSM-26220___
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| http://linked.open.../vavai/riv/strany
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| http://linked.open...avai/riv/aktivita
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| http://linked.open...avai/riv/aktivity
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| http://linked.open...vai/riv/dodaniDat
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| http://linked.open...aciTvurceVysledku
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| http://linked.open.../riv/druhVysledku
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| http://linked.open...iv/duvernostUdaju
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| http://linked.open...titaPredkladatele
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| http://linked.open...dnocenehoVysledku
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| http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26220/06:PU62150
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| http://linked.open...riv/jazykVysledku
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| http://linked.open.../riv/klicovaSlova
| - Nanophotonics, nanooptics, optical sensor, contrasts, near-field optical microscope, optical fiber probe, measurement, sensing (en)
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| http://linked.open.../riv/klicoveSlovo
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| http://linked.open...ontrolniKodProRIV
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| http://linked.open...v/mistoKonaniAkce
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| http://linked.open...i/riv/mistoVydani
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| http://linked.open...i/riv/nazevZdroje
| - Proc. of the Symposium on Photonics Technology for the 7th Framework Programme
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| http://linked.open...in/vavai/riv/obor
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| http://linked.open...ichTvurcuVysledku
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| http://linked.open...cetTvurcuVysledku
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| http://linked.open...UplatneniVysledku
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| http://linked.open...iv/tvurceVysledku
| - Grmela, Lubomír
- Tománek, Pavel
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| http://linked.open...vavai/riv/typAkce
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| http://linked.open.../riv/zahajeniAkce
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| http://linked.open...n/vavai/riv/zamer
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| number of pages
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| http://purl.org/ne...btex#hasPublisher
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| https://schema.org/isbn
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| http://localhost/t...ganizacniJednotka
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| is http://linked.open...avai/riv/vysledek
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