About: Electrical model parameter correlations assesment using DESSIS

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Description	The electrical model parameter extraction methodology proffitting from DESSIS device simulation techniques and HSPICE optimization procedures is presented. The described method based on the DESSIS-HSPICE link enables to search HSPICE model parameter correlations due to technology parameters variation. The link is capable to transform large amounts of data from DESSIS to HSPICE needed in described simple experiment. The electrical model parameters dependence on selected diode technology parameter is caalculated and displayed. The individual steps to create, mesh, and simulate diode structure, transform electrical data from DESSIS to HSPICE, extract model parameters for each technology parameter value and display the results are described. The electrical model parameter extraction methodology proffitting from DESSIS device simulation techniques and HSPICE optimization procedures is presented. The described method based on the DESSIS-HSPICE link enables to search HSPICE model parameter correlations due to technology parameters variation. The link is capable to transform large amounts of data from DESSIS to HSPICE needed in described simple experiment. The electrical model parameters dependence on selected diode technology parameter is caalculated and displayed. The individual steps to create, mesh, and simulate diode structure, transform electrical data from DESSIS to HSPICE, extract model parameters for each technology parameter value and display the results are described. (en) The electrical model parameter extraction methodology proffitting from DESSIS device simulation techniques and HSPICE optimization procedures is presented. The described method based on the DESSIS-HSPICE link enables to search HSPICE model parameter correlations due to technology parameters variation. The link is capable to transform large amounts of data from DESSIS to HSPICE needed in described simple experiment. The electrical model parameters dependence on selected diode technology parameter is caalculated and displayed. The individual steps to create, mesh, and simulate diode structure, transform electrical data from DESSIS to HSPICE, extract model parameters for each technology parameter value and display the results are described. (cs)
Title	Electrical model parameter correlations assesment using DESSIS Electrical model parameter correlations assesment using DESSIS (en) Electrical model parameter correlations assesment using DESSIS (cs)
skos:prefLabel	Electrical model parameter correlations assesment using DESSIS Electrical model parameter correlations assesment using DESSIS (en) Electrical model parameter correlations assesment using DESSIS (cs)
skos:notation	RIV/00216305:26220/05:PU54411!RIV06-MSM-26220___
http://linked.open.../vavai/riv/strany	68-71
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2006
http://linked.open...aciTvurceVysledku	Recman, Milan
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	519900
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/05:PU54411
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	device simulation, circuit simulation, model parameters extraction (en)
http://linked.open.../riv/klicoveSlovo	circuit simulation model parameters extraction device simulation
http://linked.open...ontrolniKodProRIV	[02BBE162B070]
http://linked.open...v/mistoKonaniAkce	Chania, Crete, Greece
http://linked.open...i/riv/mistoVydani	Brno
http://linked.open...i/riv/nazevZdroje	Socrates Workshop 2005, Intensive Training Programme in Electronic System Design - Proceedings
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	1 (xsd:int)
http://linked.open...UplatneniVysledku	2005
http://linked.open...iv/tvurceVysledku	Recman, Milan
http://linked.open...vavai/riv/typAkce	CST - Celostátní
http://linked.open.../riv/zahajeniAkce	2005-09-21 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Ing. Zdeněk Novotný CSc.
https://schema.org/isbn	80-214-3042-7
http://localhost/t...ganizacniJednotka	26220
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