About: Low Frequency Noise of the CdTe Crystals

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Experimental studies of transport and noise characteristics of CdTe bulk single crystals have been carried out. The noise measurement was used to characterized the quality of sample surface and contact technology. As a quality indicator we have choose the 1/f noise. In this case the 1/f noise is generated in sample volume, on surface and contacts. The main problem to be solved was the separation of these noise sources. The noise spectral density was measured by four probe method to separate contact noisse from the other sources. To distinguish between 1/f noise generated in sample volume and on the surface the noise measurement was performed as a function of incident light wavelengths for constant electric field and current was varied both by the sample illumination and photon energy change. There are three different 1/f noise sources: (i)bulk 1/f noise generated by sub band gap energy photons with current noise spectral density proportional to first power of current, (ii)surface 1/f noise generated Experimental studies of transport and noise characteristics of CdTe bulk single crystals have been carried out. The noise measurement was used to characterized the quality of sample surface and contact technology. As a quality indicator we have choose the 1/f noise. In this case the 1/f noise is generated in sample volume, on surface and contacts. The main problem to be solved was the separation of these noise sources. The noise spectral density was measured by four probe method to separate contact noisse from the other sources. To distinguish between 1/f noise generated in sample volume and on the surface the noise measurement was performed as a function of incident light wavelengths for constant electric field and current was varied both by the sample illumination and photon energy change. There are three different 1/f noise sources: (i)bulk 1/f noise generated by sub band gap energy photons with current noise spectral density proportional to first power of current, (ii)surface 1/f noise generated (en) Článek pojednává o experimentálním studiu transportu a šumových charakteristik v objemu krastalů CdTe. Šumové charakteristiky jsou mírou kvality povrchu vzorků a jejich kontaktů. Jako indikátor spolehlivosti jsme vybrali 1/f šum, který vzniká v objemu a na kontaktech. Hlavní problém je ve zjišťování příspěvku těchto zdrojů do celké úrovně 1/f šumu. (cs)
Title	Low Frequency Noise of the CdTe Crystals Low Frequency Noise of the CdTe Crystals (en) Nízkofrekvenční šum v krystalech CdTe (cs)
skos:prefLabel	Low Frequency Noise of the CdTe Crystals Low Frequency Noise of the CdTe Crystals (en) Nízkofrekvenční šum v krystalech CdTe (cs)
skos:notation	RIV/00216305:26220/05:PU52498!RIV06-GA0-26220___
http://linked.open.../vavai/riv/strany	175-178
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/05/2095), P(GA205/03/0071), Z(MSM0021620834), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2006
http://linked.open...aciTvurceVysledku	Grmela, Lubomír Moravec, Pavel Šikula, Josef Zajaček, Jiří
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	528457
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/05:PU52498
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Noise, 1/f noise, contact 1/f noise, mobility fluctuation, GR spectra (en)
http://linked.open.../riv/klicoveSlovo	Noise 1/f noise GR spectra contact 1/f noise mobility fluctuation
http://linked.open...ontrolniKodProRIV	[9C14FE0F313E]
http://linked.open...v/mistoKonaniAkce	Salamanca, Spain
http://linked.open...i/riv/mistoVydani	Salamanca, Spain
http://linked.open...i/riv/nazevZdroje	Noise and Fluctuations
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Non-linear ultrasonic defectoscopy of solids Noise sources in semiconductor materials and devices
http://linked.open...UplatneniVysledku	2005
http://linked.open...iv/tvurceVysledku	Grmela, Lubomír Moravec, Pavel Šikula, Josef Zajaček, Jiří
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2005-09-19 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Condensed Matter Physics – New Materials and Technologies Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	American Institute of Physics
https://schema.org/isbn	0-7354-0267-1
http://localhost/t...ganizacniJednotka	26220
is http://linked.open...avai/riv/vysledek of	Low Frequency Noise of the CdTe Crystals

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