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| Description
| - Noise of electrical circuits is one of the the key parameters of today's communication systems. It limits the modulation quality of the information signal, and the cross-talk to adjacent channels. The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive characterization of semiconductor materials and devices and also to determinate quality and reliability of researching devices. This applies to both active and passive components used in electricaal circuits, i.e., bipolar, quantum dots and MOS structures, on one hand, and resistors and capacitors on the other. As a main diagnostic tool it is proposed to use low frequency current or voltage noise spectral density and theirs statistical distributions. In this paper, the most important noise sources generated in semiconductors and in their interfaces will be discussed, after that on MOSFET transistor to obtain proper noise model with all known noise sources.
- Noise of electrical circuits is one of the the key parameters of today's communication systems. It limits the modulation quality of the information signal, and the cross-talk to adjacent channels. The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive characterization of semiconductor materials and devices and also to determinate quality and reliability of researching devices. This applies to both active and passive components used in electricaal circuits, i.e., bipolar, quantum dots and MOS structures, on one hand, and resistors and capacitors on the other. As a main diagnostic tool it is proposed to use low frequency current or voltage noise spectral density and theirs statistical distributions. In this paper, the most important noise sources generated in semiconductors and in their interfaces will be discussed, after that on MOSFET transistor to obtain proper noise model with all known noise sources. (en)
- šum v elektrických obvodech je jeden z klíčových parametrů dnešních komunikačních systémech. Limituje kvalitu modulace v informačních kanálech. šumová spektroskopie v časové i frekvenční oblasti je jednou ze slibných metod jak provádět nedestruktivní testování polovodičových materiálů a součástek, a zároven může sloužit k určení kvality a spolehlivosti testovaných součástek. Testovat lze jak pasivní(např. rezistory a kondenzátory) tak i aktivní součástky(např. MOS tranzistory, kvantové tečky). Jedna zz hlavních diagnostických pomůcek je měření spektrální hustoty proudu a napětí na nízkých frekvencích. Vtomto příspěvku jsou diskutovány nejčastější zdroje šumu v MOSFET tranzistorech, dále budou předložený výsledky šumových charakteristik těchto submikronových součástek. (cs)
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| Title
| - Stochastic processes in MOSFET transistors
- Stochastic processes in MOSFET transistors (en)
- Stochastické procesy v MOSFET tranzistorech (cs)
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| skos:prefLabel
| - Stochastic processes in MOSFET transistors
- Stochastic processes in MOSFET transistors (en)
- Stochastické procesy v MOSFET tranzistorech (cs)
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| skos:notation
| - RIV/00216305:26220/05:PU51881!RIV06-MSM-26220___
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| http://linked.open.../vavai/riv/strany
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| http://linked.open...avai/riv/aktivita
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| http://linked.open...avai/riv/aktivity
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| http://linked.open...vai/riv/dodaniDat
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| http://linked.open...aciTvurceVysledku
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| http://linked.open.../riv/druhVysledku
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| http://linked.open...iv/duvernostUdaju
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| http://linked.open...titaPredkladatele
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| http://linked.open...dnocenehoVysledku
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| http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26220/05:PU51881
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| http://linked.open...riv/jazykVysledku
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| http://linked.open.../riv/klicovaSlova
| - MOSFET, RTS noise, fluctuations and stochastic processes in semiconductors (en)
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| http://linked.open.../riv/klicoveSlovo
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| http://linked.open...ontrolniKodProRIV
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| http://linked.open...v/mistoKonaniAkce
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| http://linked.open...i/riv/mistoVydani
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| http://linked.open...i/riv/nazevZdroje
| - Elektronika a Informatika 2005
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| http://linked.open...in/vavai/riv/obor
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| http://linked.open...ichTvurcuVysledku
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| http://linked.open...cetTvurcuVysledku
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| http://linked.open...UplatneniVysledku
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| http://linked.open...iv/tvurceVysledku
| - Bláha, Martin
- Havránek, Jan
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| http://linked.open...vavai/riv/typAkce
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| http://linked.open.../riv/zahajeniAkce
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| http://linked.open...n/vavai/riv/zamer
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| number of pages
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| http://purl.org/ne...btex#hasPublisher
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| https://schema.org/isbn
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| http://localhost/t...ganizacniJednotka
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| is http://linked.open...avai/riv/vysledek
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