The paper deals with characterization and linearization of non-linear capacitors of MOS transistors. Basic principles of compensation are presented. A test chip for nonlinear capacitance characterization implementing a new measurement method has been developed.
The paper deals with characterization and linearization of non-linear capacitors of MOS transistors. Basic principles of compensation are presented. A test chip for nonlinear capacitance characterization implementing a new measurement method has been developed. (en)
Příspěvek pojednává o charakterizaci a linearizaci nelineárních MOS kondenzátorů. Jsou prezentovány základní principy kompenzace. Nová měřící metoda pro charakterizaci je implementována na testovacím čipu. (cs)