About: Local photoluminescence measurements of semiconductor surface defects

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The relevance of scanning near-field scanning optical microscopy (SNOM) for optical characterization of semiconductors with quantum dots is presented. The SNOM technique and some of its properties appropriate to real-time in-situ measurements are evaluated. Several optical characterization methods - widely used in the far-field, including reflectance, reflectance-difference spectroscopy, and carrier lifetime, are estimated for their use with SNOM. Experimental data are included for some of these methoods. Numerous standard optical characterization methods can be coupled with SNOM to provide higher spatial resolution. The applicability of SNOM as a real-time in-situ probe shares some of the problems of other local probe methods, but offers enough newcapabilities to assure its application. The relevance of scanning near-field scanning optical microscopy (SNOM) for optical characterization of semiconductors with quantum dots is presented. The SNOM technique and some of its properties appropriate to real-time in-situ measurements are evaluated. Several optical characterization methods - widely used in the far-field, including reflectance, reflectance-difference spectroscopy, and carrier lifetime, are estimated for their use with SNOM. Experimental data are included for some of these methoods. Numerous standard optical characterization methods can be coupled with SNOM to provide higher spatial resolution. The applicability of SNOM as a real-time in-situ probe shares some of the problems of other local probe methods, but offers enough newcapabilities to assure its application. (en) Článek ukazuje, jak může být SNOM použit na charakterizování polovodičů s kvantovými jámami. Nekteré optické charakterizační metody, které jsou značně používány ve vzdáleném poli, jako jsou odrazivost, spektroskopie diferenční odrazivosti, životnost nosičů jsou zkoumány z hlediska blízkého pole používajího SNOM. Pro některé těchto technik jsou prezentována experimentální data. (cs)
Title	Lokální měření fotoluminiscence defektů polovodičového povrchu (cs) Local photoluminescence measurements of semiconductor surface defects Local photoluminescence measurements of semiconductor surface defects (en)
skos:prefLabel	Lokální měření fotoluminiscence defektů polovodičového povrchu (cs) Local photoluminescence measurements of semiconductor surface defects Local photoluminescence measurements of semiconductor surface defects (en)
skos:notation	RIV/00216305:26220/04:PU43759!RIV/2005/MSM/262205/N
http://linked.open.../vavai/riv/strany	131-137
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(ME 544), Z(MSM 262200022)
http://linked.open...iv/cisloPeriodika	5477
http://linked.open...vai/riv/dodaniDat	2005
http://linked.open...aciTvurceVysledku	Uhdeová, Naděžda Dobisová, Markéta Tománek, Pavel Brüstlová, Jitka Dobis, Pavel
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	571697
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/04:PU43759
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Spectroscopy, near field optics, SNOM, local photoluminescence, semiconductor, surface, defects (en)
http://linked.open.../riv/klicoveSlovo	Spectroscopy defects surface semiconductor local photoluminescence SNOM near field optics
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[D09849362EE2]
http://linked.open...i/riv/nazevZdroje	Proceedings of SPIE
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	http://linked.opendata.cz/resource/domain/vavai/projekt/ME%20544
http://linked.open...UplatneniVysledku	2004
http://linked.open...v/svazekPeriodika	NEUVEDEN
http://linked.open...iv/tvurceVysledku	Tománek, Pavel Dobis, Pavel Brüstlová, Jitka Uhdeová, Naděžda Benešová, Markéta
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20262200022
issn	0277-786X
number of pages	7 (xsd:int)
http://localhost/t...ganizacniJednotka	26220

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